Improved Mass Resolving Power and Yield in Atom Probe Tomography

D.J. Larson; T.J. Prosa; J.H. Bunton; D.P. Olson; D.F. Lawrence; E. Oltman; S.N. Strennin; T.F. Kelly

doi:10.1017/S143192761300696X

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

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Haley, D. Merzlikin, S.V. Choi, P. and Raabe, D. 2014. Atom probe tomography observation of hydrogen in high-Mn steel and silver charged via an electrolytic route. International Journal of Hydrogen Energy, Vol. 39, Issue. 23, p. 12221.

Miller, Michael K. and Forbes, Richard G. 2014. Atom-Probe Tomography. p. 259.

Seol, Jae-Bok Kwak, Chang-Min Kim, Y.-T. and Park, Chan-Gyung 2016. Understanding of the field evaporation of surface modified oxide materials through transmission electron microscopy and atom probe tomography. Applied Surface Science, Vol. 368, Issue. , p. 368.

Adineh, Vahid R. Marceau, Ross K.W. Chen, Yu Si, Kae J. Velkov, Tony Cheng, Wenlong Li, Jian and Fu, Jing 2017. Pulsed-voltage atom probe tomography of low conductivity and insulator materials by application of ultrathin metallic coating on nanoscale specimen geometry. Ultramicroscopy, Vol. 181, Issue. , p. 150.

Kwak, Chang-Min Kim, Young-Tae Park, Chan-Gyung and Seol, Jae-Bok 2017. Understanding of Capping Effects on the Tip Shape Evolution and on the Atom Probe Data of Bulk LaAlO3 Using Transmission Electron Microscopy. Microscopy and Microanalysis, Vol. 23, Issue. 2, p. 329.

Prosa, Ty J. and Larson, David J. 2017. Modern Focused-Ion-Beam-Based Site-Specific Specimen Preparation for Atom Probe Tomography. Microscopy and Microanalysis, Vol. 23, Issue. 2, p. 194.

Adineh, Vahid R. Zheng, Changxi Zhang, Qianhui Marceau, Ross K. W. Liu, Boyin Chen, Yu Si, Kae J. Weyland, Matthew Velkov, Tony Cheng, Wenlong Li, Jian and Fu, Jing 2018. Graphene‐Enhanced 3D Chemical Mapping of Biological Specimens at Near‐Atomic Resolution. Advanced Functional Materials, Vol. 28, Issue. 32,

Seol, Jae Bok Kwak, Chang Min Han, Jong Chan Baek, Kyung Hum and Jeong, Young Kyu 2019. Correlative transmission electron microscopy and atom probe tomography on field evaporation mechanism of a bulk LaAlO3 oxide. Applied Surface Science, Vol. 479, Issue. , p. 828.

Li, Yujiao Zanders, David Meischein, Michael Devi, Anjana and Ludwig, Alfred 2021. Investigation of an atomic‐layer‐deposited Al2O3 diffusion barrier between Pt and Si for the use in atomic scale atom probe tomography studies on a combinatorial processing platform. Surface and Interface Analysis, Vol. 53, Issue. 8, p. 727.

Kim, Se-Ho Antonov, Stoichko Zhou, Xuyang Stephenson, Leigh T. Jung, Chanwon El-Zoka, Ayman A. Schreiber, Daniel K. Conroy, Michele and Gault, Baptiste 2022. Atom probe analysis of electrode materials for Li-ion batteries: challenges and ways forward. Journal of Materials Chemistry A, Vol. 10, Issue. 9, p. 4926.

Grandfield, Kathryn Micheletti, Chiara Deering, Joseph Arcuri, Gabriel Tang, Tengteng and Langelier, Brian 2022. Atom probe tomography for biomaterials and biomineralization. Acta Biomaterialia, Vol. 148, Issue. , p. 44.

Exertier, Florant Wang, Jiangting Fu, Jing and Marceau, Ross KW 2022. Understanding the Effects of Graphene Coating on the Electrostatic Field at the Tip of an Atom Probe Tomography Specimen. Microscopy and Microanalysis, Vol. 28, Issue. 4, p. 1054.

Singh, Mahander P. Woods, Eric V. Kim, Se‐Ho Jung, Chanwon Aota, Leonardo S. and Gault, Baptiste 2023. Facilitating the Systematic Nanoscale Study of Battery Materials by Atom Probe Tomography through in‐situ Metal Coating. Batteries & Supercaps,

Woods, Eric V Singh, Mahander P Kim, Se-Ho Schwarz, Tim M Douglas, James O El-Zoka, Ayman A Giulani, Finn and Gault, Baptiste 2023. A Versatile and Reproducible Cryo-sample Preparation Methodology for Atom Probe Studies. Microscopy and Microanalysis, Vol. 29, Issue. 6, p. 1992.

Schwarz, Tim M Woods, Eric Singh, Mahander P Chen, Xinren Jung, Chanwon Aota, Leonardo S Jang, Kyuseon Krämer, Mathias Kim, Se-Ho McCarroll, Ingrid and Gault, Baptiste 2024. In Situ Metallic Coating of Atom Probe Specimen for Enhanced Yield, Performance, and Increased Field-of-View. Microscopy and Microanalysis,

Krämer, Mathias Favelukis, Bar Sokol, Maxim Rosen, Brian A Eliaz, Noam Kim, Se-Ho and Gault, Baptiste 2024. Facilitating Atom Probe Tomography of 2D MXene Films by In Situ Sputtering. Microscopy and Microanalysis,

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Improved Mass Resolving Power and Yield in Atom Probe Tomography

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