Improved Mass Resolving Power and Yield in Atom Probe Tomography

D.J. Larson; T.J. Prosa; J.H. Bunton; D.P. Olson; D.F. Lawrence; E. Oltman; S.N. Strennin; T.F. Kelly

doi:10.1017/S143192761300696X

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

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Improved Mass Resolving Power and Yield in Atom Probe Tomography

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