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The Use of Focused Ion Beam (FIB) Technology for Cell Wall Structure Elucidation

Published online by Cambridge University Press:  09 October 2013

M. Blumentritt ,
S.D. Collins  and
S.M. Shaler
M. Blumentritt
Affiliation:
S.D. Collins
Affiliation:
S.M. Shaler
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 882 - 883
Copyright
Copyright © Microscopy Society of America 2013