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Volume 19 - August 2013

Contents

Page 39 of 70

Instrumentation Sciences

A09.02 Advances in Data Processing in Optical and Electron Microscopy

Abstract

  • Filling the Missing Wedge in Tomography: A Constraint-based Reconstruction Method for 3D TEM/STEM Imaging

  • Y. Jiang, R. Hovden, P. Ercius, D. Wang, Y. Yu, H.D. Abruña, D.A. Muller, V. Elser
  • Published online by Cambridge University Press:
    09 October 2013, pp. 768-769
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A09.03 Advances in Data Processing in Optical and Electron Microscopy

Abstract

  • Advances in 2D, 3D and 4D STEM Image Data Analysis

  • L. Jones, P.D. Nellist
  • Published online by Cambridge University Press:
    09 October 2013, pp. 770-771
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • SEM Autofocusing and Astigmatism Correction using FFT and GPGPU techniques

  • N.H. Caldwell, A.J. Marshall, B.C. Breton, D.M. Holburn
  • Published online by Cambridge University Press:
    09 October 2013, pp. 774-775
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Advanced Spectrum Analysis with Open Source Software

  • P. Cueva, D.A. Muller, R. Hovden
  • Published online by Cambridge University Press:
    09 October 2013, pp. 776-777
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A09.P1 Advances in Data Processing in Optical and Electron Microscopy

Abstract

  • 3D Multi-scale Modeling Of Early Stage Chick Limb Development

  • J. Srividhya, J.S. Gens, J.A. Glazier
  • Published online by Cambridge University Press:
    09 October 2013, pp. 780-781
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Open-Source Python Scripting and Analysis with Nion Swift

  • M.F. Murfitt, C.E. Meyer, G. Skone, N. Dellby, O.L. Krivanek
  • Published online by Cambridge University Press:
    09 October 2013, pp. 782-783
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • An Improved Workflow for Reproducible Processing and Analysis of Polycrystalline Electron Diffraction Patterns

  • J.R. Minter
  • Published online by Cambridge University Press:
    09 October 2013, pp. 784-785
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Magnetic Phase Shift Computations for Electron Tomography

  • E. Humphrey, M. De Graef
  • Published online by Cambridge University Press:
    09 October 2013, pp. 786-787
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Modified Transport-of-Intensity Approach for Electrostatic and Magnetic Phase Shift Separation

  • E. Humphrey, C. Phatak, M. De Graef
  • Published online by Cambridge University Press:
    09 October 2013, pp. 788-789
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Comparison of Magnetic Domain Wall Images using Lorentz Microscopy and Magnetic Force Microscopy

  • S. Hua, M. De Graef
  • Published online by Cambridge University Press:
    09 October 2013, pp. 790-791
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • SEM Real-time Image Processing Using a GPGPU Approach

  • N.H. Caldwell, Y. Lei, B.C. Breton, D.M. Holburn
  • Published online by Cambridge University Press:
    09 October 2013, pp. 792-793
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Novel Super-Fast Three-Dimensional SEM Image Simulation

  • P. Cizmar, C.G. Frase, H. Bosse
  • Published online by Cambridge University Press:
    09 October 2013, pp. 796-797
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Measuring and Comparing Local Strain Field and Crystal Rotation at the Microscopic Scale

  • F. Bridier, J.-C. Stinville, N. Vanderesse, M. Lagacé, P. Bocher
  • Published online by Cambridge University Press:
    09 October 2013, pp. 798-799
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Automated Structure Detection in HRTEM Images: An Example with Graphene

  • J. Kling, J.S. Vestergaard, A.L. Dahl, T.W. Hansen, R. Larsen, J.B. Wagner
  • Published online by Cambridge University Press:
    09 October 2013, pp. 802-803
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Geometry vs. Paint Models of Lattice Fringe Visibility for FCC Particles

  • S. Meyer, P. Fraundorf
  • Published online by Cambridge University Press:
    09 October 2013, pp. 804-805
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Synchronous Digitization for Modulated Signal Analysis

  • R. Muir, S. Sullivan, R. Oglesbee, G. Simpson
  • Published online by Cambridge University Press:
    09 October 2013, pp. 806-807
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Page 39 of 70