Microscopy and Microanalysis: Volume 19 -

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Volume 19 - August 2013

Contents

Page 37 of 70

Instrumentation Sciences

A08.01 EBSD and Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research

Abstract

High Angular Accuracy EBSD based on a 3D Hough Transform
C. Maurice, A.P. Day, R. Fortunier
Published online by Cambridge University Press:

09 October 2013, pp. 688-689
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Excellent Agreement Between High Resolution EBSD and XRD Strain Measurements on Si1-xGex films on Si
M.D. Vaudin, W.A. Osborn, L.H. Friedman, R.F. Cook
Published online by Cambridge University Press:

09 October 2013, pp. 690-691
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A08.02 EBSD and Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research

Abstract

Characterizing Severely Plastically Deformed Materials Using Transmission Kikuchi Diffraction and Energy Dispersive X-ray Spectroscopy in the Scanning Electron Microscope
P. Trimby
Published online by Cambridge University Press:

09 October 2013, pp. 692-693
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Transmission EBSD - Bridging the Gap between SEM and TEM
A. Avishai, J. Carter, M. Zahiri Azar, B. Narayanan, A.H. Heuer
Published online by Cambridge University Press:

09 October 2013, pp. 694-695
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

New Measurements on the Minimum and Maximum Sample Sizes in t-EBSD
R.H. Geiss, K.P. Rice, R.R. Keller
Published online by Cambridge University Press:

09 October 2013, pp. 696-697
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Femtosecond Laser Tomography Using the TriBeam System
T.M. Pollock, M.P. Echlin, A. Mottura
Published online by Cambridge University Press:

09 October 2013, pp. 698-699
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A08.03 EBSD and Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research

Abstract

Ultra-fast TEM electron diffraction tomography
S. Nicolopoulos, M. Gemmi
Published online by Cambridge University Press:

09 October 2013, pp. 700-701
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Automated High Precision Strain Measurement Using Nanobeam Diffraction Coupled with Precession
A.D. Darbal, R.D. Narayan, C. Vartuli, G. Lian, R. Graham, F. Shaapur, S. Nicolopoulos, J.K. Weiss
Published online by Cambridge University Press:

09 October 2013, pp. 702-703
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Analysis of Deformation Induced Grain Growth and Texture Development in Electrodeposited Nickel- a Quantitative Comparison between ACOM-STEM and in-situ X-ray Diffraction
C. Kuebel, A. Kobler, P. Gruber, J. Lohmiller, O. Kraft, C. Braun, M. Grewer, R. Birringer, H. Hahn
Published online by Cambridge University Press:

09 October 2013, pp. 704-705
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Towards Sub-Angström Ptychographic Diffractive Imaging
P. Wang, D.J. Batey, J.M. Rodenburg, H. Sawada, A.I. Kirkland
Published online by Cambridge University Press:

09 October 2013, pp. 706-707
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Application of diffraction mapping on crystal grain imaging
S. Wang
Published online by Cambridge University Press:

09 October 2013, pp. 708-709
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Measuring Lattice Parameters and Local Rotation using Convergent Beam Electron Diffraction: One Step Further
Y. Martin, J.-M. Zuo, V. Favre-Nicolin, J.-L. Rouvière
Published online by Cambridge University Press:

09 October 2013, pp. 710-711
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A08.04 EBSD and Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research

Abstract

Characterizing Local Misorientation Gradients Near Grain Boundaries
S. Wright, M.M. Nowell, L.H. Chan
Published online by Cambridge University Press:

09 October 2013, pp. 712-713
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Evolution of Microstructure and Microtexture in Friction Stir Welded Oxide Dispersion Strengthened Steel
B.W. Baker, S. Menon, L.N. Brewer
Published online by Cambridge University Press:

09 October 2013, pp. 714-715
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Quantitative, 3D Studies of the Evolution of Grain Size and Orientation in Nano- grained, Polycrystalline Thin-Films
A.B. Aebersold, C. Hébert, D.T.L. Alexander
Published online by Cambridge University Press:

09 October 2013, pp. 716-717
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Identifying the Electronic Properties of Grain Boundaries in CdTe Thin-film Solar Cells Using Electron Backscatter Diffraction and Electron Beam Induced Current Techniques
J. Poplawsky, C. Li, N. Paudel, Y. Yan, S. Pennycook
Published online by Cambridge University Press:

09 October 2013, pp. 718-719
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Scanning Nano Beam Electron Diffraction and Applications to Characterization of High Entropy Alloys
H. Xing, K. Kim, J.M. Zuo, M.A. Hemphill, G.Y. Wang, C.W. Tsai, J.W. Yeh, K.A. Dahmen, P.K. Liaw
Published online by Cambridge University Press:

09 October 2013, pp. 720-721
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A08.05 EBSD and Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research

Abstract

Using Electron Backscatter Diffraction (EBSD) to Investigate Causes of Seismic Anisotropy in Earth Materials: A Case Study Using Antigorite Serpentinite
S.J. Brownlee, B.R. Hacker, G.E. Harlow, G. Seward
Published online by Cambridge University Press:

09 October 2013, pp. 722-723
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Improving the Accuracy of Orientation Measurements using EBSD
K. Thomsen, N.H. Schmidt, A. Bewick, K. Larsen, J. Goulden
Published online by Cambridge University Press:

09 October 2013, pp. 724-725
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Merging Monte Carlo and Dynamical EBSD Simulations
P. Callahan, M. De Graef
Published online by Cambridge University Press:

09 October 2013, pp. 726-727
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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Page 37 of 70

Microscopy and Microanalysis

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Volume 19 - August 2013

Instrumentation Sciences

A08.01 EBSD and Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research

Abstract

High Angular Accuracy EBSD based on a 3D Hough Transform

Excellent Agreement Between High Resolution EBSD and XRD Strain Measurements on Si1-xGex films on Si

A08.02 EBSD and Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research

Abstract

Characterizing Severely Plastically Deformed Materials Using Transmission Kikuchi Diffraction and Energy Dispersive X-ray Spectroscopy in the Scanning Electron Microscope

Transmission EBSD - Bridging the Gap between SEM and TEM

New Measurements on the Minimum and Maximum Sample Sizes in t-EBSD

Femtosecond Laser Tomography Using the TriBeam System

A08.03 EBSD and Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research

Abstract

Ultra-fast TEM electron diffraction tomography

Automated High Precision Strain Measurement Using Nanobeam Diffraction Coupled with Precession

Analysis of Deformation Induced Grain Growth and Texture Development in Electrodeposited Nickel- a Quantitative Comparison between ACOM-STEM and in-situ X-ray Diffraction

Towards Sub-Angström Ptychographic Diffractive Imaging

Application of diffraction mapping on crystal grain imaging

Measuring Lattice Parameters and Local Rotation using Convergent Beam Electron Diffraction: One Step Further

A08.04 EBSD and Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research

Abstract

Characterizing Local Misorientation Gradients Near Grain Boundaries

Evolution of Microstructure and Microtexture in Friction Stir Welded Oxide Dispersion Strengthened Steel

Quantitative, 3D Studies of the Evolution of Grain Size and Orientation in Nano- grained, Polycrystalline Thin-Films

Identifying the Electronic Properties of Grain Boundaries in CdTe Thin-film Solar Cells Using Electron Backscatter Diffraction and Electron Beam Induced Current Techniques

Scanning Nano Beam Electron Diffraction and Applications to Characterization of High Entropy Alloys

A08.05 EBSD and Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research

Abstract

Using Electron Backscatter Diffraction (EBSD) to Investigate Causes of Seismic Anisotropy in Earth Materials: A Case Study Using Antigorite Serpentinite

Improving the Accuracy of Orientation Measurements using EBSD

Merging Monte Carlo and Dynamical EBSD Simulations

Microscopy and Microanalysis

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Volume 19 - August 2013

Instrumentation Sciences

A08.01 EBSD and Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research

Abstract

A08.02 EBSD and Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research

Abstract

A08.03 EBSD and Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research

Abstract

A08.04 EBSD and Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research

Abstract

A08.05 EBSD and Advanced Electron Diffraction and Automated Mapping Techniques for Geological and Materials Research

Abstract