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Volume 19 - August 2013

Contents

Page 34 of 70

Instrumentation Sciences

A04.P1 Electron Tomography in Life and Material Science

Abstract

  • Compressed Sensing Reconstruction of Smooth Signals in Electron Tomography

  • R. Leary, Z. Saghi, P.A. Midgley, D.J. Holland
  • Published online by Cambridge University Press:
    09 October 2013, pp. 568-569
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • The Effect of Noise in Images on Electron Tomography Reconstruction

  • M. Hayashida, M. Bergen, P. Li, T. Iijima, S. Ogawa, M. Malac
  • Published online by Cambridge University Press:
    09 October 2013, pp. 570-571
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Advancing Nanotomography of Polymer Systems

  • D. Chen, H. Friedrich, G. de With
  • Published online by Cambridge University Press:
    09 October 2013, pp. 572-573
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Optimizing Sampling Schemes for Electron Tomography: Dual- and Multiple-Axis Tomography

  • G. Haberfehlner, R. Serra, D. Cooper, G. Audoit, S. Barraud, P. Bleuet
  • Published online by Cambridge University Press:
    09 October 2013, pp. 574-575
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Electron and X-ray Tomography of Iron/Iron Oxide Redox Reactions for Large-Scale Hydrogen Storage

  • J. Gluch, S. Niese, C. Jung, L. Röntzsch, E. Zschech, B. Kieback
  • Published online by Cambridge University Press:
    09 October 2013, pp. 578-579
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Electrostatic Potentials of Nanostructures Revealed in 3D by Electron Holographic Tomography

  • D. Wolf
  • Published online by Cambridge University Press:
    09 October 2013, pp. 580-581
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A05.01 Revisiting Resolution for STEM and TEM

Abstract

  • Shall We Still Consider HRTEM Image Simulation to Interpret Micrographs Obtained Using Cs (and Cc) Corrected Electron Microscopes?

  • P.A. Stadelmann
  • Published online by Cambridge University Press:
    09 October 2013, pp. 582-583
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Measuring Atoms in Oxide Heterostructures by Quantitative Aberration-Corrected Transmission Electron Microscopy

  • K.W. Urban, C.-L. Jia
  • Published online by Cambridge University Press:
    09 October 2013, pp. 584-585
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Automated and Objective Numerical Aberration Correction of HRTEM Complex Exit Waves of Crystal Lattices

  • C. Ophus, M. Linck, J. Ciston
  • Published online by Cambridge University Press:
    09 October 2013, pp. 586-587
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Benefits of Chromatic Aberration Correction for Off-axis Electron Holography

  • M. Linck, U. Dahmen
  • Published online by Cambridge University Press:
    09 October 2013, pp. 588-589
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A05.02 Revisiting Resolution for STEM and TEM

Abstract

  • Cs Corrected Images and What You Don't See: Data Mining to the Physical Limits

  • D. Van Dyck, C. Kisielowski, F.-R. Chen
  • Published online by Cambridge University Press:
    09 October 2013, pp. 590-591
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Resolution of the Electron Microscope at the Atomic Scale

  • M.A. O'Keefe, L.F. Allard, D.A. Blom
  • Published online by Cambridge University Press:
    09 October 2013, pp. 592-593
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Contribution of Cc-Correction to High-Resolution TEM at All Electron Energy Loss Regimes

  • J.-G. Wen, D.J. Miller, N.J. Zaluzec, J.M. Hiller, R.E. Cook
  • Published online by Cambridge University Press:
    09 October 2013, pp. 594-595
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Atomic Structure of Through-Thickness Steps in a Grain Boundary

  • A. Gautam, F. Lancon, V. Radmilovic, U. Dahmen
  • Published online by Cambridge University Press:
    09 October 2013, pp. 596-597
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Instrumental Resolution Limit By Magnetic Thermal Noise From Conductive Parts

  • S. Uhlemann, H. Muller, P. Hartel, J. Zach, M. Haider
  • Published online by Cambridge University Press:
    09 October 2013, pp. 598-599
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A05.03 Revisiting Resolution for STEM and TEM

Abstract

  • Addressing Detector Non-Uniformity in Scanning Transmission Electron Microscopy

  • J.M. LeBeau, S.D. Findlay
  • Published online by Cambridge University Press:
    09 October 2013, pp. 600-601
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Effects of Charge Transfer in Atomic Bonding on HAADF-STEM Image Simulation

  • M.L. Odlyzko, K.A. Mkhoyan
  • Published online by Cambridge University Press:
    09 October 2013, pp. 602-603
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • Electron Beam Channeling in Single Atomic Column

  • A. Mittal, K.A. Mkhoyan
  • Published online by Cambridge University Press:
    09 October 2013, pp. 604-605
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

  • In-situ study of Nb hydride for SRF cavity applications using aberration-corrected STEM and electron energy loss spectroscopy

  • R. Tao, R.F. Klie, L. Cooley, A. Romanenko
  • Published online by Cambridge University Press:
    09 October 2013, pp. 606-607
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Page 34 of 70