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Analysis of Deformation Induced Grain Growth and Texture Development in Electrodeposited Nickel- a Quantitative Comparison between ACOM-STEM and in-situ X-ray Diffraction

Published online by Cambridge University Press:  09 October 2013

C. Kuebel ,
A. Kobler ,
P. Gruber ,
J. Lohmiller ,
O. Kraft ,
C. Braun ,
M. Grewer ,
R. Birringer  and
H. Hahn
C. Kuebel
Affiliation:
A. Kobler
Affiliation:
P. Gruber
Affiliation:
J. Lohmiller
Affiliation:
O. Kraft
Affiliation:
C. Braun
Affiliation:
M. Grewer
Affiliation:
R. Birringer
Affiliation:
H. Hahn
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 704 - 705
Copyright
Copyright © Microscopy Society of America 2013