Automated High Precision Strain Measurement Using Nanobeam Diffraction Coupled with Precession

A.D. Darbal; R.D. Narayan; C. Vartuli; G. Lian; R. Graham; F. Shaapur; S. Nicolopoulos; J.K. Weiss

doi:10.1017/S1431927613005503

Abstract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Crossref Citations

This article has been cited by the following publications. This list is generated based on data provided by Crossref.

Reisinger, M. Zalesak, J. Daniel, R. Tomberger, M. Weiss, J.K. Darbal, A.D. Petrenec, M. Zechner, J. Daumiller, I. Ecker, W. Sartory, B. and Keckes, J. 2016. Cross-sectional stress distribution in Al x Ga 1-x N heterostructure on Si(111) substrate characterized by ion beam layer removal method and precession electron diffraction. Materials & Design, Vol. 106, Issue. , p. 476.

Bowman, William J. Schweiger, Sebastian Pfenninger, Reto Izadi, Ehsan Darbal, Amith Rupp, Jennifer L.M. and Crozier, Peter A. 2017. Interfacial Strain Mapping and Chemical Analysis of Strained-Interface Heterostructures by Nanodiffraction and Electron Energy-Loss Spectroscopy. Microscopy and Microanalysis, Vol. 23, Issue. S1, p. 1776.

Bashir, Aneeqa Millar, Ross W. Gallacher, Kevin Paul, Douglas J. Darbal, Amith D. Stroud, Robert Ballabio, Andrea Frigerio, Jacopo Isella, Giovanni and MacLaren, Ian 2019. Strain analysis of a Ge micro disk using precession electron diffraction. Journal of Applied Physics, Vol. 126, Issue. 23,

MacLaren, Ian Macgregor, Thomas A. Allen, Christopher S. and Kirkland, Angus I. 2020. Detectors—The ongoing revolution in scanning transmission electron microscopy and why this important to material characterization. APL Materials, Vol. 8, Issue. 11,

Jung, Jae-Gil Cho, Young-Hee Kim, Sung-Dae Kim, Soo-Bae Lee, Sang-Hwa Song, Kyung Euh, Kwangjun and Lee, Jung-Moo 2020. Mechanism of ultrasound-induced microstructure modification in Al–Zr alloys. Acta Materialia, Vol. 199, Issue. , p. 73.

MacLaren, Ian Frutos-Myro, Enrique McGrouther, Damien McFadzean, Sam Weiss, Jon Karl Cosart, Doug Portillo, Joaquim Robins, Alan Nicolopoulos, Stavros Nebot del Busto, Eduardo and Skogeby, Richard 2020. A Comparison of a Direct Electron Detector and a High-Speed Video Camera for a Scanning Precession Electron Diffraction Phase and Orientation Mapping. Microscopy and Microanalysis, Vol. 26, Issue. 6, p. 1110.

Abadias, G. and Daniel, R. 2021. Handbook of Modern Coating Technologies. p. 359.

MacLaren, Ian Devine, Emma Gergov, Hristo Paterson, Gary Harikrishnan, K. P. Savitzky, Benjamin Ophus, Colin Yuan, Renliang Zuo, Jian-Min Forster, Kirsten Kobe, Gaja Koppany, Elizabeth McClymont, Kirsten Narendran, Anjelo and Riley, David 2021. Comparing different software packages for the mapping of strain from scanning precession diffraction data. Microscopy and Microanalysis, Vol. 27, Issue. S1, p. 2.

Das, Partha Plana-Ruiz, Sergi Galanis, Athanassios Stewart, Andrew Karavasili, Fotini Nicolopoulos, Stavros Putz, Holger Margiolaki, Irene Calamiotou, Maria and Iezzi, Gianluca 2022. Structure Determination Feasibility of Three-Dimensional Electron Diffraction in Case of Limited Data. Symmetry, Vol. 14, Issue. 11, p. 2355.

Després, Arthur Parent, Salomé Véron, Muriel Rauch, Edgar F. Joulain, Anne Bahsoun, Hadi and Tromas, Christophe 2024. Elastic strain mapping of plastically deformed materials by TEM. Ultramicroscopy, Vol. 265, Issue. , p. 114010.

Article contents

Automated High Precision Strain Measurement Using Nanobeam Diffraction Coupled with Precession

Abstract

Save article to Kindle

Save article to Dropbox

Save article to Google Drive

Reply to: Submit a response

Your details

You have entered the maximum number of contributors

Conflicting interests