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Identifying the Electronic Properties of Grain Boundaries in CdTe Thin-film Solar Cells Using Electron Backscatter Diffraction and Electron Beam Induced Current Techniques

Published online by Cambridge University Press:  09 October 2013

J. Poplawsky ,
C. Li ,
N. Paudel ,
Y. Yan  and
S. Pennycook
J. Poplawsky
Affiliation:
C. Li
Affiliation:
N. Paudel
Affiliation:
Y. Yan
Affiliation:
S. Pennycook
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 718 - 719
Copyright
Copyright © Microscopy Society of America 2013