Microscopy and Microanalysis: Volume 14 - Issue S2

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Volume 14 - Supplement S2 - August 2008

Contents

Page 23 of 41

Teaching Microscopy and Microanalysis

Research Article

A Personal Perspective on Teaching Microscopy: Lessons Learned from the Classroom and Laboratory
PM Cooke
Published online by Cambridge University Press:

03 August 2008, pp. 882-883
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Microscopy Short Courses for Industrial, Governmental, and Academic Users
CE Lyman
Published online by Cambridge University Press:

03 August 2008, pp. 884-885
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Design and Implementation of a Practical, Hands-On TEM Short Course
AW Nicholls, EF Schumacher
Published online by Cambridge University Press:

03 August 2008, pp. 886-887
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Training Objectives and Challenges of Maintaining Competency and Relevancy of Microscopy Staff in an Academic Core Facility
R Schalek
Published online by Cambridge University Press:

03 August 2008, pp. 888-889
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Coloring Pictures for Electron Microscopists, or Elements of Digital Image Manipulation for Students
VM Dusevich, JD Eick
Published online by Cambridge University Press:

03 August 2008, pp. 890-891
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

SEM Remote Control with a 3D Option
F Mighela, C Perra, R Pintus, S Podda, M Vanzi
Published online by Cambridge University Press:

03 August 2008, pp. 892-893
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Do-It-Yourself Web-Based Diagnosis for the Scanning Electron Microscope
NHM Caldwell, MT Bui, J Naran, DM Holburn, BC Breton
Published online by Cambridge University Press:

03 August 2008, pp. 894-895
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Opportunities and Challenges Growing a User Base in a Multi-User Facility
LA Dempere
Published online by Cambridge University Press:

03 August 2008, pp. 896-897
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

ImageJ: A Useful Tool for Image Processing and Analysis

Research Article

An Introduction to ImageJ: A Useful Tool for Biological Image Processing and Analysis
JB Sheffield
Published online by Cambridge University Press:

03 August 2008, pp. 898-899
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Research Article

Atomistic Studies of Line Defects at Grain Boundaries
DL Medlin, D Cohen, RC Pond, JC Hamilton, O Uche
Published online by Cambridge University Press:

03 August 2008, pp. 900-901
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

HAADF Imaging and Ab Initio Analysis of GPBII zones in Al-Cu-Mg alloys
L Kovarik, MJ Mills
Published online by Cambridge University Press:

03 August 2008, pp. 902-903
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Microstructure-Property Relationships Based on 3D Images of Polycrystals
AD Rollett, S Lee, GS Rohrer
Published online by Cambridge University Press:

03 August 2008, pp. 904-905
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

On the Evolution of Friction-Induced Microstructures in Single Crystal Nickel
SV Prasad, JR Michael, CC Battaile, BS Majumdar
Published online by Cambridge University Press:

03 August 2008, pp. 906-907
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Secondary, Backscattered and Low Energy Loss electrons in the SEM: Quantification for nano analysis
MM El-Gomati, CGH Walker, C Bonet, SP Tear, JAD Matthew
Published online by Cambridge University Press:

03 August 2008, pp. 908-909
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Artificial SEM Images for Testing Resolution-Measurement Methods
P Cizmar, AE Vladár, B Ming, MT Postek
Published online by Cambridge University Press:

03 August 2008, pp. 910-911
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Counting Electrons in Transmission Electron Microscopes
G Moldovan, X Li, P Wilshaw, AI Kirkland
Published online by Cambridge University Press:

03 August 2008, pp. 912-913
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Model of Fluctuation Electron Microscopy for a Nanocrystal /Amorphous Composite
F Yi, WG Stratton, PM Voyles
Published online by Cambridge University Press:

03 August 2008, pp. 914-915
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Research Article

The Use of Statistical Approach for Quantitative Strain Analyses with the Intensity Response of EBSD Systems
J Cocle, R Gauvin, S Yue
Published online by Cambridge University Press:

03 August 2008, pp. 916-917
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Research Article

Predicting Visibility in Elemental Maps Derived from X-ray Spectrum Images
D Newbury, D Bright, J Davis, N Ritchie
Published online by Cambridge University Press:

03 August 2008, pp. 918-919
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Research Article

Modeling Electron Diffraction and Imaging in Microscopes with Aberration Correctors for Quantitative Materials Structural Analysis
JM Zuo, WJ Huang, A Shah, R Kröeger
Published online by Cambridge University Press:

03 August 2008, pp. 920-921
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Page 23 of 41

Microscopy and Microanalysis

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Volume 14 - Supplement S2 - August 2008

Teaching Microscopy and Microanalysis

Research Article

A Personal Perspective on Teaching Microscopy: Lessons Learned from the Classroom and Laboratory

Microscopy Short Courses for Industrial, Governmental, and Academic Users

Design and Implementation of a Practical, Hands-On TEM Short Course

Training Objectives and Challenges of Maintaining Competency and Relevancy of Microscopy Staff in an Academic Core Facility

Coloring Pictures for Electron Microscopists, or Elements of Digital Image Manipulation for Students

SEM Remote Control with a 3D Option

Do-It-Yourself Web-Based Diagnosis for the Scanning Electron Microscope

Opportunities and Challenges Growing a User Base in a Multi-User Facility

ImageJ: A Useful Tool for Image Processing and Analysis

Research Article

An Introduction to ImageJ: A Useful Tool for Biological Image Processing and Analysis

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Research Article

Atomistic Studies of Line Defects at Grain Boundaries

HAADF Imaging and Ab Initio Analysis of GPBII zones in Al-Cu-Mg alloys

Microstructure-Property Relationships Based on 3D Images of Polycrystals

On the Evolution of Friction-Induced Microstructures in Single Crystal Nickel

Secondary, Backscattered and Low Energy Loss electrons in the SEM: Quantification for nano analysis

Artificial SEM Images for Testing Resolution-Measurement Methods

Counting Electrons in Transmission Electron Microscopes

Model of Fluctuation Electron Microscopy for a Nanocrystal /Amorphous Composite

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Research Article

The Use of Statistical Approach for Quantitative Strain Analyses with the Intensity Response of EBSD Systems

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Research Article

Predicting Visibility in Elemental Maps Derived from X-ray Spectrum Images

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Research Article

Modeling Electron Diffraction and Imaging in Microscopes with Aberration Correctors for Quantitative Materials Structural Analysis

Microscopy and Microanalysis

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Volume 14 - Supplement S2 - August 2008

Teaching Microscopy and Microanalysis

Research Article

ImageJ: A Useful Tool for Image Processing and Analysis

Research Article

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Research Article

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Research Article

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Research Article

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Research Article