Microscopy and Microanalysis: Volume 14 - Issue S2

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Volume 14 - Supplement S2 - August 2008

Contents

Page 22 of 41

Transmission Electron Microscopy Techniques and Applications

Research Article

On-line Dynamic Digital Electron Holography
T Hirayama, K Yamamoto, K Urata
Published online by Cambridge University Press:

03 August 2008, pp. 842-843
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Improving Image Quality and Reducing Drift Problems via Automated Data Acquisition and Averaging in Cs-corrected TEM
E Voelkl, B Jiang, ZR Dai, JP Bradley
Published online by Cambridge University Press:

03 August 2008, pp. 844-845
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Absolute Strain at the Nanoscale from HREM Images
CL Johnson, E Snoeck, MJ Hÿtch
Published online by Cambridge University Press:

03 August 2008, pp. 846-847
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Atomic Resolution Imaging of Solid State Phase Separation in a Beta-Stabilized Titanium Alloy
S Nag, A Genç, R Banerjee, HL Fraser
Published online by Cambridge University Press:

03 August 2008, pp. 848-849
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Simple Method for Estimating Relaxation in Silicon from Higher Order Laue Zone Line Splitting
DR Diercks, MJ Kaufman, A Needleman
Published online by Cambridge University Press:

03 August 2008, pp. 850-851
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Comparison of Zone Axes for Convergent Beam Electron Diffraction Strain Measurements of a Strained Silicon Transistor
DR Diercks, MJ Kaufman
Published online by Cambridge University Press:

03 August 2008, pp. 852-853
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Evaluating Visibility and Spatial Resolution in Electron Holography
RA McLeod, M Malac
Published online by Cambridge University Press:

03 August 2008, pp. 854-855
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Teaching Microscopy and Microanalysis

Research Article

Odyssey of a Chemical Microscopist
JG Delly
Published online by Cambridge University Press:

03 August 2008, pp. 856-857
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Remote-Access Scanning Electron Microscopy for K-12 Students: The Bugscope Project Nine Years On
C Wallace, C Conway, AM Ray, SJ Robinson
Published online by Cambridge University Press:

03 August 2008, pp. 858-859
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

AFM Learning Activities for a 7-11 Grade Nanotechnology Course
DN Leonard, PE Russell
Published online by Cambridge University Press:

03 August 2008, pp. 860-861
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Sherlock Holmes to CSI: Microscopy in the Forensic Geology Classroom
TJ Williams
Published online by Cambridge University Press:

03 August 2008, pp. 862-863
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Teaching Aids for Optical Mineralogy in the Geosciences
DE Kile
Published online by Cambridge University Press:

03 August 2008, pp. 864-865
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Training Electron Microscopy Technicians
MS Kostrna
Published online by Cambridge University Press:

03 August 2008, pp. 866-867
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Electron Microscope Education in the Community College
F Villalovoz, C Davis
Published online by Cambridge University Press:

03 August 2008, pp. 868-869
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Manufacturer Training of Electron Microscopists: X-ray Microanalysis
N Rowlands, A Drake
Published online by Cambridge University Press:

03 August 2008, pp. 870-871
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Remote Teaching for Electron Microscopy
TC Isabell, Y Ohkura, T Kobayashi, RM O'Donnell
Published online by Cambridge University Press:

03 August 2008, pp. 872-873
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Remote Microscopy for Education and Outreach
S Seraphin, G Chandler, M Sellers, D Bentley, K Dorame, S Hernandez
Published online by Cambridge University Press:

03 August 2008, pp. 874-875
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Remote Microscopy for Training Groups of Student Users
JF Mansfield
Published online by Cambridge University Press:

03 August 2008, pp. 876-877
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Teaching Advanced Transmission Electron Microscopy
PA Crozier, RW Carpenter, DJ Smith, K Weiss
Published online by Cambridge University Press:

03 August 2008, pp. 878-879
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Methodologies for Teaching Undergraduate Level Electron Microscopy
BL McIntyre
Published online by Cambridge University Press:

03 August 2008, pp. 880-881
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Page 22 of 41

Microscopy and Microanalysis

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Volume 14 - Supplement S2 - August 2008

Transmission Electron Microscopy Techniques and Applications

Research Article

On-line Dynamic Digital Electron Holography

Improving Image Quality and Reducing Drift Problems via Automated Data Acquisition and Averaging in Cs-corrected TEM

Absolute Strain at the Nanoscale from HREM Images

Atomic Resolution Imaging of Solid State Phase Separation in a Beta-Stabilized Titanium Alloy

Simple Method for Estimating Relaxation in Silicon from Higher Order Laue Zone Line Splitting

Comparison of Zone Axes for Convergent Beam Electron Diffraction Strain Measurements of a Strained Silicon Transistor

Evaluating Visibility and Spatial Resolution in Electron Holography

Teaching Microscopy and Microanalysis

Research Article

Odyssey of a Chemical Microscopist

Remote-Access Scanning Electron Microscopy for K-12 Students: The Bugscope Project Nine Years On

AFM Learning Activities for a 7-11 Grade Nanotechnology Course

Sherlock Holmes to CSI: Microscopy in the Forensic Geology Classroom

Teaching Aids for Optical Mineralogy in the Geosciences

Training Electron Microscopy Technicians

Electron Microscope Education in the Community College

Manufacturer Training of Electron Microscopists: X-ray Microanalysis

Remote Teaching for Electron Microscopy

Remote Microscopy for Education and Outreach

Remote Microscopy for Training Groups of Student Users

Teaching Advanced Transmission Electron Microscopy

Methodologies for Teaching Undergraduate Level Electron Microscopy

Microscopy and Microanalysis

Refine listing

Actions for selected content:

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Volume 14 - Supplement S2 - August 2008

Transmission Electron Microscopy Techniques and Applications

Research Article

Teaching Microscopy and Microanalysis

Research Article