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Predicting Visibility in Elemental Maps Derived from X-ray Spectrum Images

Published online by Cambridge University Press:  03 August 2008

D Newbury ,
D Bright ,
J Davis  and
N Ritchie
D Newbury
Affiliation:
National Institute of Standards and Technology
D Bright
Affiliation:
National Institute of Standards and Technology
J Davis
Affiliation:
National Institute of Standards and Technology
N Ritchie
Affiliation:
National Institute of Standards and Technology
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 918 - 919
Copyright
© 2008 Microscopy Society of America

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