Microscopy and Microanalysis: Volume 14 - Issue S2

< Back to all issues

Volume 14 - Supplement S2 - August 2008

Contents

Page 21 of 41

TEM Accessory Instrumentation and Automation

Research Article

Auto-Adjustment of Aberration Correction and Experimental Evaluation of R005 Microscope
S Sawada, F Hosokawa, T Kaneyama, T Tomita, Y Kondo, T Tanaka, Y Oshima, Y Tanishiro, K Takayanagi
Published online by Cambridge University Press:

03 August 2008, pp. 802-803
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Design and Characterization of 64 MegaPixel Fiber Optic Coupled CMOS Detector for Transmission Electron Microscopy
HR Tietz
Published online by Cambridge University Press:

03 August 2008, pp. 804-805
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

A Pixel Array Detector for Scanning Transmission Electron Microscopy
P Ercius, T Caswell, MW Tate, A Ercan, SM Gruner, D Muller
Published online by Cambridge University Press:

03 August 2008, pp. 806-807
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Development of Fast CCD Cameras for in-situ Electron Microscopy
L Tsung, B Mollon, Y Jia, P Mooney, C Mao, M Pan
Published online by Cambridge University Press:

03 August 2008, pp. 808-809
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Electron Gun Design for Pulsed TEM Operation
A Ziegler
Published online by Cambridge University Press:

03 August 2008, pp. 810-811
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Automated 3D Reconstruction of Serial Electron Microscopy Image Sequences Using Object Recognition
Y Lu, S Shaham
Published online by Cambridge University Press:

03 August 2008, pp. 812-813
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Development of Double-Probe Piezo-Driving Holder for TEM
K Yamazaki, I Ishikawa, S Deguchi, Y Kondo, Y Murakami, D Shindo
Published online by Cambridge University Press:

03 August 2008, pp. 814-815
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Development of Stage-Scanning Type Confocal STEM
A Hashimoto, M Takeguchi, M Shimojo, K Mitsuishi, K Furuya
Published online by Cambridge University Press:

03 August 2008, pp. 816-817
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Use of a commercial RF plasma cleaner in eliminating adventitious carbon contamination in an XPS system
E Strein, D Allred, MR Linford
Published online by Cambridge University Press:

03 August 2008, pp. 818-819
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Reduction of Electron Beam Induced Specimen Contaminations by Chemical Cleaning of a TEM Column Using Oxygen Plasma
S Horiuchi, T Hanada, M Ebisawa
Published online by Cambridge University Press:

03 August 2008, pp. 820-821
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Soft-X-ray emission spectroscopy study of transition intensities from the valence band to 3D core-hole of lanthanide oxides
M Terauchi, Y Yoneda
Published online by Cambridge University Press:

03 August 2008, pp. 822-823
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Transmission Electron Microscopy Techniques and Applications

Research Article

Very Low Energy TEM Diffraction of Nanostructures
B McMorran, A Cronin
Published online by Cambridge University Press:

03 August 2008, pp. 824-825
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Development of New Diffraction Microscope Based on Conventional Scanning Electron Microscope
O Kamimura, T Dobashi, K Kawahara, T Abe, K Gohara
Published online by Cambridge University Press:

03 August 2008, pp. 826-827
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Measurement of Electron Beam Coherence Using a Lau Interferometer
B McMorran, A Cronin
Published online by Cambridge University Press:

03 August 2008, pp. 828-829
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Control of Parasitic Aberrations in Multipole Corrector Optics
PE Batson
Published online by Cambridge University Press:

03 August 2008, pp. 830-831
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Aberration Corrected Lorentz Microscopy for Perpendicular Magnetic Recording Media
C Phatak, JA Bain, JG Zhu, M De Graef
Published online by Cambridge University Press:

03 August 2008, pp. 832-833
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Young’s Fringes Are Not Evidence of HRTEM Resolution
MA O'Keefe, LF Allard, DA Blom
Published online by Cambridge University Press:

03 August 2008, pp. 834-835
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Development of Sample Preparation Method for Observation of Dopant Profile by Electron Holography
T Sato, H Matsumoto, M Konno, M Fukui, S Mamishin, Y Taniguchi, H Kasai
Published online by Cambridge University Press:

03 August 2008, pp. 836-837
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

In-line Point Projection Holography of Titanium Oxide Nanoparticles
L Livadaru, M Malac, R Wolkow
Published online by Cambridge University Press:

03 August 2008, pp. 838-839
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Routine Phase Resolution of 2π/100 and Better in Off-axis (Electron) Holography
E Voelkl
Published online by Cambridge University Press:

03 August 2008, pp. 840-841
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Page 21 of 41

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 14 - Supplement S2 - August 2008

TEM Accessory Instrumentation and Automation

Research Article

Auto-Adjustment of Aberration Correction and Experimental Evaluation of R005 Microscope

Design and Characterization of 64 MegaPixel Fiber Optic Coupled CMOS Detector for Transmission Electron Microscopy

A Pixel Array Detector for Scanning Transmission Electron Microscopy

Development of Fast CCD Cameras for in-situ Electron Microscopy

Electron Gun Design for Pulsed TEM Operation

Automated 3D Reconstruction of Serial Electron Microscopy Image Sequences Using Object Recognition

Development of Double-Probe Piezo-Driving Holder for TEM

Development of Stage-Scanning Type Confocal STEM

Use of a commercial RF plasma cleaner in eliminating adventitious carbon contamination in an XPS system

Reduction of Electron Beam Induced Specimen Contaminations by Chemical Cleaning of a TEM Column Using Oxygen Plasma

Soft-X-ray emission spectroscopy study of transition intensities from the valence band to 3D core-hole of lanthanide oxides

Transmission Electron Microscopy Techniques and Applications

Research Article

Very Low Energy TEM Diffraction of Nanostructures

Development of New Diffraction Microscope Based on Conventional Scanning Electron Microscope

Measurement of Electron Beam Coherence Using a Lau Interferometer

Control of Parasitic Aberrations in Multipole Corrector Optics

Aberration Corrected Lorentz Microscopy for Perpendicular Magnetic Recording Media

Young’s Fringes Are Not Evidence of HRTEM Resolution

Development of Sample Preparation Method for Observation of Dopant Profile by Electron Holography

In-line Point Projection Holography of Titanium Oxide Nanoparticles

Routine Phase Resolution of 2π/100 and Better in Off-axis (Electron) Holography

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 14 - Supplement S2 - August 2008

TEM Accessory Instrumentation and Automation

Research Article

Transmission Electron Microscopy Techniques and Applications

Research Article