Microscopy and Microanalysis: Volume 14 - Issue S2

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Volume 14 - Supplement S2 - August 2008

Contents

Page 24 of 41

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Research Article

Simulation of Atomic Resolution Images in STEM
LJ Allen, AJ D'Alfonso, M Bosman, SD Findlay, MP Oxley, VJ Keast, JM LeBeau, S Stemmer
Published online by Cambridge University Press:

03 August 2008, pp. 922-923
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Critical Role of Inelastic Interactions in Quantitative Electron Microscopy
KA Mkhoyan, SE Maccagnano-Zacher, MG Thomas, J Silcox
Published online by Cambridge University Press:

03 August 2008, pp. 924-925
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Controlling Channeling Effects in Aberration-Corrected STEM Tomography
HL Xin, V Intaraprasonk, DA Muller
Published online by Cambridge University Press:

03 August 2008, pp. 926-927
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Simulating Atomic Resolution STEM Images of Non-Periodic Samples
SD Findlay, AJ D'Alfonso, LJ Allen, MP Oxley, PD Nellist, EC Cosgriff, G Behan, A Kirkland, N Shibata, T Mizoguchi, Y Ikuhara
Published online by Cambridge University Press:

03 August 2008, pp. 928-929
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Quantitative Image Simulation for Scanning Transmission Electron Microscopy
MP Oxley, K van Benthem, SJ Pennycook
Published online by Cambridge University Press:

03 August 2008, pp. 930-931
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Geometrical Interpretation and Simulation of HOLZ Patterns
XZ Li
Published online by Cambridge University Press:

03 August 2008, pp. 932-933
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

EBSD Characterization of the Deformation Behavior of Alloy 182 Weld Metal
MA Othon, MM Morra
Published online by Cambridge University Press:

03 August 2008, pp. 934-935
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Computation of Current Density in Particle Beams
M Oral, A Vladár
Published online by Cambridge University Press:

03 August 2008, pp. 936-937
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

HAADF Imaging and MD Simulations of Microtwining Partial Dislocations in Nickel Based Superalloy Rene 104,
L Kovarik, RR Unocic, J Li, MJ Mills
Published online by Cambridge University Press:

03 August 2008, pp. 938-939
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

High-resolution electron imaging of amorphous layers with aberration-corrected probes
S Maccagnano-Zacher, A Mkhoyan, J Silcox
Published online by Cambridge University Press:

03 August 2008, pp. 940-941
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Quantitative Image Contrast Variations in STEM
K van Benthem, MP Oxley, C Kreyenschulte, SJ Pennycook
Published online by Cambridge University Press:

03 August 2008, pp. 942-943
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

An Experimental and Monte Carlo Study of Secondary Electron Emission from Elemental Solids
CGH Walker, MM El-Gomati, AMD Assa'd, M Zadražil
Published online by Cambridge University Press:

03 August 2008, pp. 944-945
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Monte Carlo Modeling of the Low-loss Electron Signal in Scanning Electron Microscopy and Comparison with the BSE Signal
C Bonet, A Pratt, M El-Gomati, JAD Matthew, SP Tear
Published online by Cambridge University Press:

03 August 2008, pp. 946-947
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Cross Sections for the Ionization of Atoms by Electron Impact. A Numerical Database and an Analytical Formula
D Bote, F Salvat-Pujol, JA Escuder, CJ Powell, F Salvat
Published online by Cambridge University Press:

03 August 2008, pp. 948-949
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Scanning Probe Microscopy in the Physical and Biological Sciences

Research Article

Multimodal Atomic Force Microscopy for Nanomedicine: Biological Nanoimaging, Nanomechanics and Nanodevices
R Lal, S Ramachandran, F Teran Arce, M Allen, A Quist
Published online by Cambridge University Press:

03 August 2008, pp. 950-951
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Single Cell Viability Measured by Scanning Electrochemical Microscopy and Live/DeadTM Staining
KM Jeerage, TL Oreskovic, N Goldstein, DS Lauria
Published online by Cambridge University Press:

03 August 2008, pp. 952-953
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Contrast Mechanism for Visualization of Ferroelectric Domains with Scanning Force Microscopy
T Jungk, Á Hoffmann, E Soergel
Published online by Cambridge University Press:

03 August 2008, pp. 954-955
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Probing Molecular Machines on Surfaces: The Nanocar and Beyond
KF Kelly
Published online by Cambridge University Press:

03 August 2008, pp. 956-957
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Lateral Resolution in Piezoresponse Force Microscopy
T Jungk, Á Hoffmann, E Soergel
Published online by Cambridge University Press:

03 August 2008, pp. 958-959
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Local Potential Imaging of a Multilayer Ceramic Capacitor Using Kelvin Probe Force Microscopy
T Komatsubara, S Higuchi, K Nishikata, N Satoh, K Kobayashi, H Yamada
Published online by Cambridge University Press:

03 August 2008, pp. 960-961
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Page 24 of 41

Microscopy and Microanalysis

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Volume 14 - Supplement S2 - August 2008

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Research Article

Simulation of Atomic Resolution Images in STEM

Critical Role of Inelastic Interactions in Quantitative Electron Microscopy

Controlling Channeling Effects in Aberration-Corrected STEM Tomography

Simulating Atomic Resolution STEM Images of Non-Periodic Samples

Quantitative Image Simulation for Scanning Transmission Electron Microscopy

Geometrical Interpretation and Simulation of HOLZ Patterns

EBSD Characterization of the Deformation Behavior of Alloy 182 Weld Metal

Computation of Current Density in Particle Beams

HAADF Imaging and MD Simulations of Microtwining Partial Dislocations in Nickel Based Superalloy Rene 104,

High-resolution electron imaging of amorphous layers with aberration-corrected probes

Quantitative Image Contrast Variations in STEM

An Experimental and Monte Carlo Study of Secondary Electron Emission from Elemental Solids

Monte Carlo Modeling of the Low-loss Electron Signal in Scanning Electron Microscopy and Comparison with the BSE Signal

Cross Sections for the Ionization of Atoms by Electron Impact. A Numerical Database and an Analytical Formula

Scanning Probe Microscopy in the Physical and Biological Sciences

Research Article

Multimodal Atomic Force Microscopy for Nanomedicine: Biological Nanoimaging, Nanomechanics and Nanodevices

Single Cell Viability Measured by Scanning Electrochemical Microscopy and Live/DeadTM Staining

Contrast Mechanism for Visualization of Ferroelectric Domains with Scanning Force Microscopy

Probing Molecular Machines on Surfaces: The Nanocar and Beyond

Lateral Resolution in Piezoresponse Force Microscopy

Local Potential Imaging of a Multilayer Ceramic Capacitor Using Kelvin Probe Force Microscopy

Microscopy and Microanalysis

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Volume 14 - Supplement S2 - August 2008

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Research Article

Scanning Probe Microscopy in the Physical and Biological Sciences

Research Article