Microscopy and Microanalysis: Volume 14 - Issue S2

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Volume 14 - Supplement S2 - August 2008

Contents

Page 25 of 41

Scanning Probe Microscopy in the Physical and Biological Sciences

Research Article

Dynamic Studies of Nanoscale Thermal and Mechanical Property Development of Automotive Refinish Clearcoats
LT Germinario, D Bhattacharya, A Forster
Published online by Cambridge University Press:

03 August 2008, pp. 962-963
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Aggregation Phenomena Studied by AFM and MDSC in Nanocarbon Composite Membranes
LP Terrazas-Bandala, G González-Sánchez, EA Zaragoza, R Ibarra, A Torres, V Nevárez, ML Ballinas
Published online by Cambridge University Press:

03 August 2008, pp. 964-965
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Study of the Surface Porosity of Cellulose Triacetate Membranes by AFM
LP Terrazas-Bandala, G González-Sánchez, ML Ballinas-Casarrubias
Published online by Cambridge University Press:

03 August 2008, pp. 966-967
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

FIB-Based Applications and Instrumentation Advances for the Physical and Biological Sciences

Research Article

FIB Milling of Frozen-hydrated Cells and Tissue for TEM Cryo-Tomography
M Marko, C Hsieh, N Salmon, M Rodriguez, J Frank, C Mannella
Published online by Cambridge University Press:

03 August 2008, pp. 968-969
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

DualBeam Electron Microscopy for Targeted Whole Cell Architecture
BM Humbel, DAM De Winter, CTWM Schneijdenberg, B Lich, AJ Verkleij
Published online by Cambridge University Press:

03 August 2008, pp. 970-971
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

3D Imaging of Diatoms with Ion Abrasion Scanning Electron Microscopy
M Hildebrand, S Kim, D Shi, S Subramaniam
Published online by Cambridge University Press:

03 August 2008, pp. 972-973
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Direct Three-Dimensional Microstructural Characterization and Reconstruction Across Varying Length Scales in α/β Titanium Alloys by Serial Sectioning Using a FEI DualBeam™ (FIB/SEM) and Robo-Met.3D
REA Williams, V Dixit, P Collins, HL Fraser
Published online by Cambridge University Press:

03 August 2008, pp. 974-975
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Low Energy Ga+ and Ar+ Ion Milling for Improved EBSD Sample Preparation
JR Michael, PG Kotula
Published online by Cambridge University Press:

03 August 2008, pp. 976-977
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Measuring the Five Parameter Grain Boundary Character Distribution From Three-Dimensional Orientation Maps
SJ Dillon, S Lee, AD Rollett, GS Rohrer
Published online by Cambridge University Press:

03 August 2008, pp. 978-979
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

A 3D Analysis of the Nugget Zone of AA5052 Processed via Friction Stir Processing
M Adams-Hughes, PN Kalu, EL Principe, S Wright
Published online by Cambridge University Press:

03 August 2008, pp. 980-981
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

3D Energy-Dispersive X-ray Spectrometry (3D EDXS) in a DualBeam FIB: Aspects of Sample Preparation and Quantitative Analysis
M Schaffer, H Schröttner, J Wagner
Published online by Cambridge University Press:

03 August 2008, pp. 982-983
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Reconstruction of δ-phase in Superalloy by 3D EDXS in a DualBeam FIB
J Wagner, M Schaffer, H Schröttner, S Mitsche, I Letofsky-Papst, C Stotter, C Sommitsch
Published online by Cambridge University Press:

03 August 2008, pp. 984-985
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Large area patterning using ion-beam lithography
LE Ocala, A Imre
Published online by Cambridge University Press:

03 August 2008, pp. 986-987
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

FIB Fabrication of Metallic Nanostructures on End-faces of Cleaved Optical Fibers for Chemical Sensing Applications
PE Russell, A Dhawan, J Gleeson
Published online by Cambridge University Press:

03 August 2008, pp. 988-989
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Development of Novel Thin Film Deposition Methods in a CrossBeam® FIB-SEM Platform Using an OmniGISTM
EL Principe, C Hartfield, R Kruger, A Smith
Published online by Cambridge University Press:

03 August 2008, pp. 990-991
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Site-Specific Studies of Electrical Heterogeneities in Ni-BaTiO3 Multilayer Ceramic Capacitors Using FIB and AEM
GY Yang, PJ Moses, EC Dickey, CA Randall
Published online by Cambridge University Press:

03 August 2008, pp. 992-993
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Sub-stage with Remote Control of Specimen Rotation for Use in FIB/SEM Tools
DJ MacMahon
Published online by Cambridge University Press:

03 August 2008, pp. 994-995
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

FIB preparation of cross-sectional polymer thin film TEM samples
S Kim, A Minor
Published online by Cambridge University Press:

03 August 2008, pp. 996-997
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Sample Preparation for Aberration Corrected Microscopy
A Genç, D Huber, D Basile, HL Fraser, P Fischione
Published online by Cambridge University Press:

03 August 2008, pp. 998-999
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

In-Situ Sample Preparation and Modeling of SEM-STEM Imaging
RJ Young, A Buxbaum, B Peterson, R Schampers
Published online by Cambridge University Press:

03 August 2008, pp. 1000-1001
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Page 25 of 41

Microscopy and Microanalysis

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Volume 14 - Supplement S2 - August 2008

Scanning Probe Microscopy in the Physical and Biological Sciences

Research Article

Dynamic Studies of Nanoscale Thermal and Mechanical Property Development of Automotive Refinish Clearcoats

Aggregation Phenomena Studied by AFM and MDSC in Nanocarbon Composite Membranes

Study of the Surface Porosity of Cellulose Triacetate Membranes by AFM

FIB-Based Applications and Instrumentation Advances for the Physical and Biological Sciences

Research Article

FIB Milling of Frozen-hydrated Cells and Tissue for TEM Cryo-Tomography

DualBeam Electron Microscopy for Targeted Whole Cell Architecture

3D Imaging of Diatoms with Ion Abrasion Scanning Electron Microscopy

Direct Three-Dimensional Microstructural Characterization and Reconstruction Across Varying Length Scales in α/β Titanium Alloys by Serial Sectioning Using a FEI DualBeam™ (FIB/SEM) and Robo-Met.3D

Low Energy Ga+ and Ar+ Ion Milling for Improved EBSD Sample Preparation

Measuring the Five Parameter Grain Boundary Character Distribution From Three-Dimensional Orientation Maps

A 3D Analysis of the Nugget Zone of AA5052 Processed via Friction Stir Processing

3D Energy-Dispersive X-ray Spectrometry (3D EDXS) in a DualBeam FIB: Aspects of Sample Preparation and Quantitative Analysis

Reconstruction of δ-phase in Superalloy by 3D EDXS in a DualBeam FIB

Large area patterning using ion-beam lithography

FIB Fabrication of Metallic Nanostructures on End-faces of Cleaved Optical Fibers for Chemical Sensing Applications

Development of Novel Thin Film Deposition Methods in a CrossBeam® FIB-SEM Platform Using an OmniGISTM

Site-Specific Studies of Electrical Heterogeneities in Ni-BaTiO3 Multilayer Ceramic Capacitors Using FIB and AEM

Sub-stage with Remote Control of Specimen Rotation for Use in FIB/SEM Tools

FIB preparation of cross-sectional polymer thin film TEM samples

Sample Preparation for Aberration Corrected Microscopy

In-Situ Sample Preparation and Modeling of SEM-STEM Imaging

Microscopy and Microanalysis

Refine listing

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Volume 14 - Supplement S2 - August 2008

Scanning Probe Microscopy in the Physical and Biological Sciences

Research Article

FIB-Based Applications and Instrumentation Advances for the Physical and Biological Sciences

Research Article