Microscopy and Microanalysis: Volume 14 - Issue S2

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Volume 14 - Supplement S2 - August 2008

Contents

Page 20 of 41

Hyperspectral Imaging, Cathodoluminescence, and Soft X-ray Analysis

Research Article

Correlating Composition and Luminescence Variations in III-Nitride Semiconductor Alloys
PR Edwards, K Bejtka, IM Watson, S Fernández-Garrido, E Calleja, RW Martin, KP O'Donnell
Published online by Cambridge University Press:

03 August 2008, pp. 762-763
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Analysis of Combined Multi-signal Hyperspectral Datasets Using a Clustering Algorithm and Visualisation Tools
N Wilson, C MacRae, A Torpy
Published online by Cambridge University Press:

03 August 2008, pp. 764-765
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Methodology for the Quantification of Hyperspectral Cathodoluminescence
CM MacRae, NC Wilson, A Torpy
Published online by Cambridge University Press:

03 August 2008, pp. 766-767
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Spectral imaging with an annular Si-drift detector and annular x-ray detector simulated by stage and scan rotation in the SEM
PG Kotula
Published online by Cambridge University Press:

03 August 2008, pp. 768-769
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

X-ray Spectrum Imaging of Sintering Additives in Thick-Film (Pb, La)(Zr, Ti)O3
CM Parish, BB McKenzie, MR Winter, BA Tuttle
Published online by Cambridge University Press:

03 August 2008, pp. 770-771
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Hyperspectral analysis in soft x-ray spectromicroscopy
C Jacobsen, H Fleckenstein
Published online by Cambridge University Press:

03 August 2008, pp. 772-773
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Statistical and Systematic Errors in EFTEM Spectral Imaging
IM Anderson, A Herzing
Published online by Cambridge University Press:

03 August 2008, pp. 774-775
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Multivariate Analysis of XPS Data for Enhanced Chemical Information
JE Fulghum, K Artyushkova
Published online by Cambridge University Press:

03 August 2008, pp. 776-777
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Acquisition of Combined Real/Reciprocal Space Multi-Dimensional Datasets
RD Twesten, P Thomas
Published online by Cambridge University Press:

03 August 2008, pp. 778-779
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Hardware and Software for Nano-Area Diffractive Imaging in S/TEM
VV Volkov, J Wall, Y Zhu
Published online by Cambridge University Press:

03 August 2008, pp. 780-781
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Fast Hyperspectral Raman Imaging with Confocal Raman Microscopy at Optimized Spatial Resolution
M Kalbac, E Lee, A Zoubir, A Whitley
Published online by Cambridge University Press:

03 August 2008, pp. 782-783
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Enhancing the Field of View for Cathodoluminescence Spectrum Imaging in the Scanning Electron Microscope
DJ Stowe, PJ Thomas, SA Galloway
Published online by Cambridge University Press:

03 August 2008, pp. 784-785
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Enhanced Mapping of C Kα with a Grazing-incidence X-ray Optic
G Brown, D O'Hara
Published online by Cambridge University Press:

03 August 2008, pp. 786-787
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

TEM Accessory Instrumentation and Automation

Research Article

Development of a high accuracy, large range and backlash free single-tilt/rotation (alpha-gamma) holder for precise alignment of TEM samples
N Salmon, D Vetter, EA Stach
Published online by Cambridge University Press:

03 August 2008, pp. 788-789
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Specially Designed Sample Holder and In-situ TEM for Gas-Solid Interaction Studies at an Atomic Resolution
XF Zhang
Published online by Cambridge University Press:

03 August 2008, pp. 790-791
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

A New Paradigm for Ultra-High-Resolution Imaging at Elevated Temperatures
LF Allard, WC Bigelow, D Nackashi, J Damiano, SE Mick
Published online by Cambridge University Press:

03 August 2008, pp. 792-793
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Four-dimensional STEM-EELS tomography of nano-structured materials
K Jarausch, D Leonard, R Twesten, P Thomas
Published online by Cambridge University Press:

03 August 2008, pp. 794-795
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Electronic structure studies of carbon materials by high energy-resolution carbon K-emission spectroscopy measurements
M Terauchi, H Nishihara, T Kyotani
Published online by Cambridge University Press:

03 August 2008, pp. 796-797
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Automated Large Scale Tilt Pair Data Collection for TEM
C Yoshioka, N Voss, J Pulokas, D Fellmann, A Cheng, B Carragher, C Potter
Published online by Cambridge University Press:

03 August 2008, pp. 798-799
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Progress on the Development of a Cc/Cs Corrector for TEAM
M Haider, P Hartel, U Loebau, R Hoeschen, H Müller, S Uhlemann, F Kahl, F Zach
Published online by Cambridge University Press:

03 August 2008, pp. 800-801
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Page 20 of 41

Microscopy and Microanalysis

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Volume 14 - Supplement S2 - August 2008

Hyperspectral Imaging, Cathodoluminescence, and Soft X-ray Analysis

Research Article

Correlating Composition and Luminescence Variations in III-Nitride Semiconductor Alloys

Analysis of Combined Multi-signal Hyperspectral Datasets Using a Clustering Algorithm and Visualisation Tools

Methodology for the Quantification of Hyperspectral Cathodoluminescence

Spectral imaging with an annular Si-drift detector and annular x-ray detector simulated by stage and scan rotation in the SEM

X-ray Spectrum Imaging of Sintering Additives in Thick-Film (Pb, La)(Zr, Ti)O3

Hyperspectral analysis in soft x-ray spectromicroscopy

Statistical and Systematic Errors in EFTEM Spectral Imaging

Multivariate Analysis of XPS Data for Enhanced Chemical Information

Acquisition of Combined Real/Reciprocal Space Multi-Dimensional Datasets

Hardware and Software for Nano-Area Diffractive Imaging in S/TEM

Fast Hyperspectral Raman Imaging with Confocal Raman Microscopy at Optimized Spatial Resolution

Enhancing the Field of View for Cathodoluminescence Spectrum Imaging in the Scanning Electron Microscope

Enhanced Mapping of C Kα with a Grazing-incidence X-ray Optic

TEM Accessory Instrumentation and Automation

Research Article

Development of a high accuracy, large range and backlash free single-tilt/rotation (alpha-gamma) holder for precise alignment of TEM samples

Specially Designed Sample Holder and In-situ TEM for Gas-Solid Interaction Studies at an Atomic Resolution

A New Paradigm for Ultra-High-Resolution Imaging at Elevated Temperatures

Four-dimensional STEM-EELS tomography of nano-structured materials

Electronic structure studies of carbon materials by high energy-resolution carbon K-emission spectroscopy measurements

Automated Large Scale Tilt Pair Data Collection for TEM

Progress on the Development of a Cc/Cs Corrector for TEAM

Microscopy and Microanalysis

Refine listing

Actions for selected content:

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Volume 14 - Supplement S2 - August 2008

Hyperspectral Imaging, Cathodoluminescence, and Soft X-ray Analysis

Research Article

TEM Accessory Instrumentation and Automation

Research Article