Microscopy and Microanalysis: Volume 9 - Issue S03

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 9 - Issue S03 - September 2003

Invited Papers

Z-contrast imaging in a conventional TEM

Experiencies and Possibilities with a 200 kV Monochromated (S)TEM

On the site occupancy of dopants in 4H-SiC

Coherence in a Plasmon-Scattered Wavefield

High energy resolution EELS using a monochromized 200 kV TEM: Comparative investigation of titanium oxides

Simulation of Energy-Selected Electron Diffraction Patterns

Effects of Sample Preparation on Cr-Steels: An EFTEM Study

Investigation of Precipitates using an Energy-Filtering Transmission Electron Microscope (EFTEM)

Polarity Determination of Sphalerite-type <110> and <001> Crystal Samples Using Simple Bragg-line Contrast Rules

Quantitative EELS of nitrided gate oxides

Strategies for investigating core-shell particles by energy-filtered transmission electron microscopy

Electron energy-loss near-edge structures of silicon carbides

Low Energy Electron Scattering and Electrical Charging in Non-conductive Specimen

EDX and Cathodoluminecence Depth Analysis in Ion-implanted SiO2 Layers

New Detection Principles on the GEMINI SUPRA FE-SEM

Efficiency of Collection of the Secondary Electrons in SEM

MONCA: A New MATLAB Package for Monte Carlo Simulation of Electron Scattering in Thin Specimens in the Energy Range 10 – 200 keV

MASDET: A New MATLAB Package for Mass Determination of Matter Using Transmitted Scattered Electrons

Kossel X-ray Microdiffraction and EBSD as Complementary Methods in the SEM

Computer Controlled Low Energy SEM

Microscopy and Microanalysis

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Volume 9 - Issue S03 - September 2003

Invited Papers