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Kossel X-ray Microdiffraction and EBSD as Complementary Methods in the SEM

Published online by Cambridge University Press:  05 September 2003

E. Langer ,
S. Däbritz  and
W. Hauffe
E. Langer
Affiliation:
Institute for Surface and Microstructure Physics, University of Dresden, D-01062 Dresden, Germany
S. Däbritz
Affiliation:
Institute for Surface and Microstructure Physics, University of Dresden, D-01062 Dresden, Germany
W. Hauffe
Affiliation:
Institute for Surface and Microstructure Physics, University of Dresden, D-01062 Dresden, Germany
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Abstract

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Type
Invited Papers
Information
Microscopy and Microanalysis , Volume 9 , Issue S03 , September 2003 , pp. 114 - 115
Copyright
Copyright © Microscopy Society of America 2003

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