Microscopy and Microanalysis: Volume 9 - Issue S03

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 9 - Issue S03 - September 2003

Invited Papers

State of the First Aberration-Corrected, Monochromized 200kV FEG-TEM

High spatial resolution electron energy loss spectroscopy and imaging in an aberration corrected STEM

Solving the Inverse Problem: a “brute force” method

Numerical Nanodiffraction of Amorphous Grain Boundary Films

Is there a Stobbs-Factor in Off-axis Electron Holography?

Atomic Structure Imaging Using an Aberration-Corrected Transmission Electron Microscope

Enhanced imaging of thin intergranular films in HRTEM using Fourier filtering

Quantitative HAADF-STEM image analysis using IMAGE-WARP processing

HREM Study of Hexagonal and Rhombohedral Graphites for use as Anodes in Lithium Ion Batteries

Stability of parameter retrieval using inverse electron scattering

New Tools for Imaging, Spectroscopy and Diffraction from Nanostructures

Image analysis and simulation software in transmission electron microscopy

Quantitative Evaluation of Focal Series in HRTEM

Electron Interference Fringes observed in Fourier Space and its Application

Design and First Results of SESAM

Core-hole Effect on the ELNES of SrTiO3: Experiment and Theory

TEM Investigation on Dislocation Density Reduction by In Situ Deposited SiN Intermediate Layers in MOVPE Grown AlGaNlGaN Heterostructures on Sic and A1203 Substrates

EFTEM and EELS at the Frontiers of Spatial and Energy Resolution: What does “Resolution” mean in Practice?

Electron Energy-Loss Near-Edge Structure Spectroscopy of Titanium and Vanadium in Fresnoite Framework Structures

Quantitative EFTEM by Bivariate Histogram Analysis

Microscopy and Microanalysis

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Volume 9 - Issue S03 - September 2003

Invited Papers