Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Giannuzzi, Lucille A.
Yu, Zhiyang
Yin, Denise
Harmer, Martin P.
Xu, Qiang
Smith, Noel S.
Chan, Lisa
Hiller, Jon
Hess, Dustin
and
Clark, Trevor
2015.
Theory and New Applications ofEx SituLift Out.
Microscopy and Microanalysis,
Vol. 21,
Issue. 4,
p.
1034.
Hrnčíř, Tomáš
Lang, Christian
Vincenc Oboňa, Jozef
and
Barták, Tomáš
2015.
In-Situ EDS Characterization of TEM Lamellae Created by Xe Plasma FIB.
Microscopy and Microanalysis,
Vol. 21,
Issue. S3,
p.
1405.
Jiruse, J.
Havelka, M.
Polster, J.
and
Hrncif, T.
2015.
Xe Plasma FIB-SEM with Improved Resolution of Both Ion and Electron Columns.
Microscopy and Microanalysis,
Vol. 21,
Issue. S3,
p.
1995.
Oboňa, Jozef Vincenc
Hrnčíř, Tomáš
Sharang
Šikula, Marek
and
Denisyuk, Andrey
2016.
Xe plasma FIB Delayering of IC based on 14 nm node technology.
Microscopy and Microanalysis,
Vol. 22,
Issue. S3,
p.
56.
Benkouider, Abdelmalek
Sharang, Sharang
Hrnčíř, Tomaš
Oboňa, Jozef Vincenc
Jiruše, Jaroslav
and
Principe, Edward
2016.
European Microscopy Congress 2016: Proceedings.
p.
398.
Maurya, Sanjeev Kumar
Paul, Samit
Shah, Jay Kumar
Chatterjee, Sanghamitro
and
Bhattacharjee, Sudeep
2017.
Momentum transfer using variable gaseous plasma ion beams and creation of high aspect ratio microstructures.
Journal of Applied Physics,
Vol. 121,
Issue. 12,
Loeber, Thomas Henning
Laegel, Bert
Wolff, Sandra
Schuff, Sebastian
Balle, Frank
Beck, Tilmann
Eifler, Dietmar
Fitschen, Jan Henrik
and
Steidl, Gabriele
2017.
Reducing curtaining effects in FIB/SEM applications by a goniometer stage and an image processing method.
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena,
Vol. 35,
Issue. 6,
Slater, T. J. A.
Bradley, R. S.
Bertali, G.
Geurts, R.
Northover, S. M.
Burke, M. G.
Haigh, S. J.
Burnett, T. L.
and
Withers, P. J.
2017.
Multiscale correlative tomography: an investigation of creep cavitation in 316 stainless steel.
Scientific Reports,
Vol. 7,
Issue. 1,
Pillatsch, Lex
Östlund, Fredrik
and
Michler, Johann
2019.
FIBSIMS: A review of secondary ion mass spectrometry for analytical dual beam focussed ion beam instruments.
Progress in Crystal Growth and Characterization of Materials,
Vol. 65,
Issue. 1,
p.
1.
Maurya, Sanjeev Kumar
Barman, Sushanta
Pan, Nandita
and
Bhattacharjee, Sudeep
2019.
Effect of plasma and beam parameters on focal dimensions in micrometer charged particle optics: Enhanced nonlinear demagnification below the Debye length.
Physics of Plasmas,
Vol. 26,
Issue. 6,
Cordova, Dmitri Leo M.
and
Johnson, David C.
2020.
Synthesis of Metastable Inorganic Solids with Extended Structures.
ChemPhysChem,
Vol. 21,
Issue. 13,
p.
1345.
Shichi, Hiroyasu
and
Tomimatsu, Satoshi
2020.
Ga-contamination-free scanning transmission electron microscope sample preparation by rectangular-shaped oxygen-ion-beam thinning using projection ion beam optical system.
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena,
Vol. 38,
Issue. 5,
Maurya, Sanjeev Kumar
and
Bhattacharjee, Sudeep
2020.
Variable gaseous ion beams from plasmas driven by electromagnetic waves for nano-micro structuring: a tutorial and an overview of recent works and future prospects.
Plasma Research Express,
Vol. 2,
Issue. 3,
p.
033001.
Brunetto, Rosario
Aléon, Jérôme
Aléon-Toppani, Alice
Borg, Janet
and
Djouadi, Zahia
2021.
Sample Return Missions.
p.
315.
Jaworski, Maciej
Chudzyńska, Aleksandra
Mrowiński, Paweł
Prażmowska-Czajka, Joanna
Kijaszek, Wojciech
Große, Jan
Rodt, Sven
Reitzenstein, Stephan
and
Sęk, Grzegorz
2023.
Xenon-plasma focused ion beam processing of photonic microstructures with GaAs-based quantum dots.
Optical Materials Express,
Vol. 13,
Issue. 10,
p.
2845.
Jiménez, Juan Jesús
Jaekel, Konrad
Pauly, Christoph
Schäfer, Christian
Bartsch, Heike
Mücklich, Frank
and
Morales, Francisco Miguel
2024.
Impact of Sample Preparation Approach on Transmission Electron Microscopy Investigation of Sputtered AlNi Multilayers Used for Reactive Soldering.
Advanced Engineering Materials,
Jaworski, Maciej
Mrowiński, Paweł
Mikulicz, Marek G.
Holewa, Paweł
Zeidler, Laura
Syperek, Marcin
Semenova, Elizaveta
and
Sęk, Grzegorz
2024.
Xenon plasma-focused ion beam milling for fabrication of high-purity, bright single-photon sources operating in the C-band.
Optics Express,
Vol. 32,
Issue. 23,
p.
41089.