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High Speed TEM Sample Preparation by Xe FIB

Published online by Cambridge University Press:  27 August 2014

A. Delobbe
Affiliation:
Orsay Physics, Application department, Fuveau, France
O. Salord
Affiliation:
Orsay Physics, Application department, Fuveau, France
T. Hrncir
Affiliation:
TESCAN Brno, R&D department, Brno, Czech Republic
A. David
Affiliation:
Biophy Research, Fuveau, France
P. Sudraud
Affiliation:
Orsay Physics, Application department, Fuveau, France
F. Lopour
Affiliation:
TESCAN Brno, R&D department, Brno, Czech Republic

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2014 

References

References:

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