Hostname: page-component-586b7cd67f-2plfb Total loading time: 0 Render date: 2024-11-26T04:31:54.193Z Has data issue: false hasContentIssue false
  • English
  • Français

Imaging Perpendicular Magnetic Domains in Plan-view Using Lorentz Transmission Electron Microscopy

Published online by Cambridge University Press:  27 August 2014

Taeho Roy Kim ,
Ai Leen Koh  and
Robert Sinclair
Taeho Roy Kim
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA 94305-4034
Ai Leen Koh
Affiliation:
Stanford Nanocharacterization Laboratory, Stanford University, Stanford, CA 94305-4045
Robert Sinclair
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA 94305-4034

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 286 - 287
Copyright
Copyright © Microscopy Society of America 2014 

References

References:

[1] Dunin-Borkowski, R. E. et al, Science 282.5395 (1998) p. 1868-1870.Google Scholar
[2] Tang, K. et al, IEEE Trans. Magn. 32.5 (1996) p. 4130-4132.Google Scholar
[3] Bertero, G. et al, TMRC Proceedings A2 (2010) p. 3-4.Google Scholar
[4] The authors acknowledge Western Digital Media Inc. for the funding and also recording bits on the hard disk sample for this study.Google Scholar