No CrossRef data available.
Article contents
FIB Applications: A Historical Perspective
Published online by Cambridge University Press: 27 August 2014
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
- Type
- Abstract
- Information
- Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 294 - 295
- Copyright
- Copyright © Microscopy Society of America 2014
References
[8] “Introduction to Focused Ion Beams: Theory, Instrumentation, Applications, and Practice”,L.A. Giannuzzi and F.A Stevie, eds., Springer, NY (2005).Google Scholar
[13]
Whitby, J. A., et al., Advances in Materials Science and Engineering, 2012 (2012) Article ID 180437.Google Scholar
You have
Access