Microscopy and Microanalysis: Volume 18 - Proceedings of Microscopy & Microanalysis 2012

Widening the Window of Particle Beam Technology: Helium Ion Microscopy
M. Postek, A.E. Vladar, B. Ming, K. Purushotham
Published online by Cambridge University Press:

23 November 2012, pp. 802-803
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

High angular intensity gas field ion source with single atom tip
H. Moritani, S. Matsubara, T. Hashizume
Published online by Cambridge University Press:

23 November 2012, pp. 804-805
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Exploiting channeling in Helium Ion Microscopy
G. Hlawacek, V. Veligura, T.F. Mocking, A. George, R. van Gastel, H.W. Zandvliet, B. Poelsema, S. Lorbek
Published online by Cambridge University Press:

23 November 2012, pp. 806-807
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

A Study of Helium Ion Beam Substrate Interaction Volume on Nanomachining Profiles in Bulk Substrates and Thin Film Membranes
R. Livengood, S. Tan, Y. Greenzweig, R. Hallstein, D. Shima, K. Klein, A.E. Vladar
Published online by Cambridge University Press:

23 November 2012, pp. 808-809
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Luminescence imaging and spectroscopy of rare earth doped lanthanum nanoparticles in a helium ion microscope
T.M. Franklin, S.A. Boden, D.M. Bagnall, H.N. Rutt, L. Scipioni
Published online by Cambridge University Press:

23 November 2012, pp. 810-811
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Towards Secondary Ion Mass Spectrometry On The Helium Ion Microscope
T. Wirtz, L. Pillatsch, N. Vanhove, D. Dowsett, S. Sijbrandij, J. Notte
Published online by Cambridge University Press:

23 November 2012, pp. 812-813
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Characterization of Damage in SiO2 during Helium Ion Microscope Observation by Luminescence and TEM-EELS
S. Ogawa, T. Iijima, S. Awata, R. Sugie, N. Kawasaki, Y. Otsuka
Published online by Cambridge University Press:

23 November 2012, pp. 814-815
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Site specific He ion irradiation damage studies in nanolayered thin films by cross-coupling Helium Ion Microscopy with TEM and APT
S. Vaithaiyalingam, A. Devaraj, V. Venkata Rama Shesha R, C. Wang, T. Varga, S. Thevuthasan, C.H. Henager
Published online by Cambridge University Press:

23 November 2012, pp. 816-817
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Engineering Of Memristors For Crossbar Devices Using The Helium Ion Microscope
D. Winston, D. Ohlberg, J. Strachan, R.S. Williams
Published online by Cambridge University Press:

23 November 2012, pp. 818-819
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Quantitative Dopant Contrast in Scanning Electron Microscope and Helium Ion Microscope Using Focused Ion Beam Prepared Specimens
H. Zhang, Y. Chen
Published online by Cambridge University Press:

23 November 2012, pp. 820-821
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Neon Gas Field Ion Source: Trimer and Single Atom Tip Comparison
R. Urban, R. Wolkow, J. Pitters, S. Matsubara
Published online by Cambridge University Press:

23 November 2012, pp. 822-823
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Secondary Electrons Energy Distribution In Helium Ion Microscope And Contrast Manipulation
Y. Petrov, O. Vyvenko
Published online by Cambridge University Press:

23 November 2012, pp. 824-825
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Nano-structuring and modification with a focused helium ion beam
D. Fox, Y. Chen, C. Faulkner, H. Zhang
Published online by Cambridge University Press:

23 November 2012, pp. 826-827
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

High Resolution Imaging Of The Rat Kidney Epithelium By Helium Ion Microscopy
W.L. Rice, A. Van Hoek, D. Brown, C. Huynh, L. Scipioni
Published online by Cambridge University Press:

23 November 2012, pp. 828-829
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Understanding Surface Modification of Silicon-based Materials using Gas Field Ion Source FIB for Nano-Machining Applications
K.L. Klein, C. Huynh, L. Stern, A. Vladar, J. Melngailis, X. Cai
Published online by Cambridge University Press:

23 November 2012, pp. 830-831
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Increasing Ion-current Density by Modifying the Radius of Curvature at the Apex of an Ion-emitter Tip
S. Matsubara, H. Shichi, T. Hashizume
Published online by Cambridge University Press:

23 November 2012, pp. 832-833
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Advances in Correlated Light and Electron Microscopy Imaging Probes
T.J. Deerinck, E. Bushong, R. Tsien, M. Ellisman, X. Shu
Published online by Cambridge University Press:

23 November 2012, pp. 834-835
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Preserving Fluorescent Protein Signal after High Pressure Freezing and Freeze Substitution of Arabidopsis Leaf Tissue
C.B. Johnson, A. Smith, S. Vitha, A. Holzenburg
Published online by Cambridge University Press:

23 November 2012, pp. 836-837
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Laboratory cryogenic soft x-ray tomography and correlative microscopy: 3D visualization inside the cell
J.E. Evans, D. Carlson, J. Gelb, V. Palshin
Published online by Cambridge University Press:

23 November 2012, pp. 838-839
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Diffraction-limited IR Microspectroscopy with IRENI
J. Sedlmair, M. Unger, B. Illman, C. Hirschmugl
Published online by Cambridge University Press:

23 November 2012, pp. 840-841
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2012

Instrumentation Symposium

Helium Ion Microscopy-02

Research Article

Widening the Window of Particle Beam Technology: Helium Ion Microscopy

High angular intensity gas field ion source with single atom tip

Exploiting channeling in Helium Ion Microscopy

A Study of Helium Ion Beam Substrate Interaction Volume on Nanomachining Profiles in Bulk Substrates and Thin Film Membranes

Helium Ion Microscopy-03

Research Article

Luminescence imaging and spectroscopy of rare earth doped lanthanum nanoparticles in a helium ion microscope

Towards Secondary Ion Mass Spectrometry On The Helium Ion Microscope

Characterization of Damage in SiO2 during Helium Ion Microscope Observation by Luminescence and TEM-EELS

Site specific He ion irradiation damage studies in nanolayered thin films by cross-coupling Helium Ion Microscopy with TEM and APT

Engineering Of Memristors For Crossbar Devices Using The Helium Ion Microscope

Helium Ion Microscopy-04

Research Article

Quantitative Dopant Contrast in Scanning Electron Microscope and Helium Ion Microscope Using Focused Ion Beam Prepared Specimens

Neon Gas Field Ion Source: Trimer and Single Atom Tip Comparison

Secondary Electrons Energy Distribution In Helium Ion Microscope And Contrast Manipulation

Nano-structuring and modification with a focused helium ion beam

High Resolution Imaging Of The Rat Kidney Epithelium By Helium Ion Microscopy

Understanding Surface Modification of Silicon-based Materials using Gas Field Ion Source FIB for Nano-Machining Applications

Increasing Ion-current Density by Modifying the Radius of Curvature at the Apex of an Ion-emitter Tip

Correlative Microscopy and Chemical Imaging-01

Research Article

Advances in Correlated Light and Electron Microscopy Imaging Probes

Preserving Fluorescent Protein Signal after High Pressure Freezing and Freeze Substitution of Arabidopsis Leaf Tissue

Laboratory cryogenic soft x-ray tomography and correlative microscopy: 3D visualization inside the cell

Diffraction-limited IR Microspectroscopy with IRENI

Microscopy and Microanalysis

Refine listing

Actions for selected content:

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Proceedings of Microscopy & Microanalysis 2012

Instrumentation Symposium

Helium Ion Microscopy-02

Research Article

Helium Ion Microscopy-03

Research Article

Helium Ion Microscopy-04

Research Article

Correlative Microscopy and Chemical Imaging-01

Research Article