Microscopy and Microanalysis: Volume 18 - Proceedings of Microscopy & Microanalysis 2012

Electron Channeling Contrast Image (ECCI) Simulations
M. De Graef
Published online by Cambridge University Press:

23 November 2012, pp. 682-683
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films
C. Trager-Cowan, G. Naresh-Kumar, B. Hourahine, P.R. Edwards, J. Bruckbauer, R.W. Martin, C. Mauder, A.P. Day, G. England, A. Winkelmann, P.J. Parbrook, A. Wilkinson
Published online by Cambridge University Press:

23 November 2012, pp. 684-685
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

New insights on quantitative microstructure characterization by electron channeling contrast imaging under controlled diffraction conditions in SEM
I. Gutierrez-Urrutia, D. Raabe
Published online by Cambridge University Press:

23 November 2012, pp. 686-687
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Characterization of Dislocation Contrast in deformed steels with BCC structure by Electron Channeling Contrast Imaging Method
M. Sugiyama, G. Shigesato, Y. Shinohara
Published online by Cambridge University Press:

23 November 2012, pp. 688-689
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Quantitative defect analysis using electron channeling contrast imaging under controlled diffraction conditions (cECCI)
N. Elhami, C. Tasan, S. Zaefferer
Published online by Cambridge University Press:

23 November 2012, pp. 690-691
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Quantitative Measurement of the Plastic Strain Field at a Fatigue Crack Tip using Backscattered Electron Images
Y. Yang, M.A. Crimp, R.A. Tomlinson, E.A. Patterson
Published online by Cambridge University Press:

23 November 2012, pp. 692-693
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Ion Channeling vs. Electron Channeling Image Contrast
L.A. Giannuzzi, J.R. Michael
Published online by Cambridge University Press:

23 November 2012, pp. 694-695
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Channeling Contrast in Helium Ion Microscopy
D.C. Bell
Published online by Cambridge University Press:

23 November 2012, pp. 696-697
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Channeling in Scanning Transmission Helium-Ion Microscopy
L.J. Allen, A.J. D'Alfonso
Published online by Cambridge University Press:

23 November 2012, pp. 698-699
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Comparison of Electron Channeling Contrast Imaging (ECCI) and Electron Back Scattered Diffraction (EBSD) using Hitachi SU8000 FE-SEM
S. Kaboli, J. Su, R. Gauvin
Published online by Cambridge University Press:

23 November 2012, pp. 700-701
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Characterizing Slip Transfer In Commercially Pure Titanium Using High Resolution Electron Backscatter Diffraction (HR-EBSD) and Electron Channeling Contrast Imaging (ECCI)
J.R. Seal, T. Bieler, M. Crimp, B. Britton, A. Wilkinson
Published online by Cambridge University Press:

23 November 2012, pp. 702-703
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Hybridisation & Band gap contrast from LL-BSE electrons
H. Jaksch
Published online by Cambridge University Press:

23 November 2012, pp. 704-705
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Dislocation Analysis in Metal-Oxide Materials and Devices by Electron Channeling Contrast Imaging
R. Kamaladasa, M. Norman, Y. Lu, J.A. Bain, P.A. Salvador, M. Skowronski, M. De Graef, Y.N. Picard
Published online by Cambridge University Press:

23 November 2012, pp. 706-707
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Surface Preparation for Characterizing Microstructure on Transuranic Oxides by Electron Backscatter Spectroscopy and Ion Beam Imaging
P.A. Papin, C. Chris, R.T. Forsyth, E.P. Luther, C.T. Necker
Published online by Cambridge University Press:

23 November 2012, pp. 708-709
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Zone axis STEM defect imaging based on electron Kossel patterns
P. Phillips, J. Kwon, M. Brandes, M. Mills, M. De Graef
Published online by Cambridge University Press:

23 November 2012, pp. 710-711
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Vortex Beams Hosted in On-Axis Crystals
H.L. Xin, H. Zheng
Published online by Cambridge University Press:

23 November 2012, pp. 712-713
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Failure of The Incoherent Imaging Approximation in “Sub-Angstrom” STEM Images: A Real-Space Consequence of Electron Channeling
R. Hovden, H.L. Xin, D.A. Muller
Published online by Cambridge University Press:

23 November 2012, pp. 714-715
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

ALCHEMI in the Twenty-First Century: A Contemporary Overview
I.M. Anderson
Published online by Cambridge University Press:

23 November 2012, pp. 716-717
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Dislocation Identification and Mapping in GaN by Electron Channeling Contrast Imaging
Y.N. Picard, R.J. Kamaladasa, F. Liu, L. Huang, L. Porter, R.F. Davis
Published online by Cambridge University Press:

23 November 2012, pp. 718-719
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Correlative characterization of the local deformation response and gage volume microstructure of pure Ni micro-samples via in-situ SEM testing and 3D EBSD
P. Shade, M. Groeber, M. Uchic, R. Wheeler
Published online by Cambridge University Press:

23 November 2012, pp. 720-721
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2012

Instrumentation Symposium

Channeling Effects in Microscopy and Microanalysis-02

Research Article

Electron Channeling Contrast Image (ECCI) Simulations

Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films

New insights on quantitative microstructure characterization by electron channeling contrast imaging under controlled diffraction conditions in SEM

Characterization of Dislocation Contrast in deformed steels with BCC structure by Electron Channeling Contrast Imaging Method

Quantitative defect analysis using electron channeling contrast imaging under controlled diffraction conditions (cECCI)

Channeling Effects in Microscopy and Microanalysis-03

Research Article

Quantitative Measurement of the Plastic Strain Field at a Fatigue Crack Tip using Backscattered Electron Images

Ion Channeling vs. Electron Channeling Image Contrast

Channeling Contrast in Helium Ion Microscopy

Channeling in Scanning Transmission Helium-Ion Microscopy

Channeling Effects in Microscopy and Microanalysis-04

Research Article

Comparison of Electron Channeling Contrast Imaging (ECCI) and Electron Back Scattered Diffraction (EBSD) using Hitachi SU8000 FE-SEM

Characterizing Slip Transfer In Commercially Pure Titanium Using High Resolution Electron Backscatter Diffraction (HR-EBSD) and Electron Channeling Contrast Imaging (ECCI)

Hybridisation & Band gap contrast from LL-BSE electrons

Dislocation Analysis in Metal-Oxide Materials and Devices by Electron Channeling Contrast Imaging

Surface Preparation for Characterizing Microstructure on Transuranic Oxides by Electron Backscatter Spectroscopy and Ion Beam Imaging

Zone axis STEM defect imaging based on electron Kossel patterns

Vortex Beams Hosted in On-Axis Crystals

Failure of The Incoherent Imaging Approximation in “Sub-Angstrom” STEM Images: A Real-Space Consequence of Electron Channeling

ALCHEMI in the Twenty-First Century: A Contemporary Overview

Dislocation Identification and Mapping in GaN by Electron Channeling Contrast Imaging

Measurement and Visualization of Mechanical Behavior at Micro and Nano-scales-01

Research Article

Correlative characterization of the local deformation response and gage volume microstructure of pure Ni micro-samples via in-situ SEM testing and 3D EBSD

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2012

Instrumentation Symposium

Channeling Effects in Microscopy and Microanalysis-02

Research Article

Channeling Effects in Microscopy and Microanalysis-03

Research Article

Channeling Effects in Microscopy and Microanalysis-04

Research Article

Measurement and Visualization of Mechanical Behavior at Micro and Nano-scales-01

Research Article