Microscopy and Microanalysis: Volume 18 - Proceedings of Microscopy & Microanalysis 2012

Advances in Atomic Force Microscopy, from Compositional Mapping to Quantitative Measurements
C. Wall, S. Magonov, J. Alexander, S. Belikov
Published online by Cambridge University Press:

23 November 2012, pp. 922-923
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

How to Obtain Rigidity Modulus of Biological Cells Using AFM
I. Sokolov, M. Dokukin, N. Guz, C.D. Woodworht
Published online by Cambridge University Press:

23 November 2012, pp. 924-925
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

New Applications in Atom Probe Tomography
D.J. Larson, D.A. Reinhard, T.J. Prosa, D. Olson, D. Lawrence, P.H. Clifton, R.M. Ulfig, I. Martin, T.F. Kelly, V.S. Smentkowski, L.M. Gordon, D. Joester, K. Inoue
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23 November 2012, pp. 926-927
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Atom Probe Tomography Analysis of Grain Boundaries in CdTe
D.J. Larson, D.A. Reinhard, T.J. Prosa, D. Olson, D. Lawrence, P.H. Clifton, R.M. Ulfig, T.F. Kelly, V.S. Smentkowski
Published online by Cambridge University Press:

23 November 2012, pp. 928-929
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Latest developments on NanoSIMS instrumentation for life science and materials
F. Horreard, F. Hillion
Published online by Cambridge University Press:

23 November 2012, pp. 930-931
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Characterization of Fine Surface Structure with a New Electron Detection System in FE-SEM
N. Erdman, Y. Sakuda, S. Asahina, K. Tsutsumi, M. Shibata, M. Kudo
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23 November 2012, pp. 932-933
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Crystallographic Image Processing for Scanning Probe Microscopes
T. Bilyeu, B. Moon, P. Moeck
Published online by Cambridge University Press:

23 November 2012, pp. 934-935
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Applying an Atomic Force Microscopy in the Study of Sulfide Flotation
J. Zhang, W. Zhang
Published online by Cambridge University Press:

23 November 2012, pp. 936-937
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Characteristics in valence-band emission spectra of simple metals and transition metals obtained by SXES-TEM
M. Terauchi, H. Takahashi, N. Handa, T. Murano, M. Koike, T. Kawachi, T. Imazono, N. Hasegawa, M. Koeda, T. Nagano, H. Sasai, Y. Oue, Z. Yonezawa, S. Kuramoto
Published online by Cambridge University Press:

23 November 2012, pp. 938-939
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Defining a minimum analytical mass in geological reference samples using μXRF mapping capacity
P. Bedard, A. Neron, S. Barnes
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23 November 2012, pp. 940-941
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Prediction of Detection Limits of Micro X-Ray Fluorescence (μXRF)
D. Hodoroaba, V. Rackwitz
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23 November 2012, pp. 942-943
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

A Flexible Cryojet-Cooled X-ray Fluorescence Microprobe: Initial Results
B. Lai, S. Chen, Q. Jin, L. Finney, C. Jacobsen, S. Vogt, M. Bolbat, K. Brister
Published online by Cambridge University Press:

23 November 2012, pp. 944-945
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Rapid elemental distributions with high sensitivity by µ-XRF M.Haschke1, U.Waldschläger1, R.Tagle1, U.Rossek1 1 Bruker Nano GmbH, Berlin, Germany
M. Haschke, U. Waldschläger , R. Tagle, U. Rossek
Published online by Cambridge University Press:

23 November 2012, pp. 946-947
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Multivariate Statistical Analysis Strategies of μ-XRF Spectral Images
P.G. Kotula, M.A. Rodriguez
Published online by Cambridge University Press:

23 November 2012, pp. 948-949
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Time Reduction Strategies in Large Area µXRF Imaging
J. Davis
Published online by Cambridge University Press:

23 November 2012, pp. 950-951
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Applications of Micro X-Ray Fluorescence in Concrete
B. Sudbrink, T. Ley, J.M. Davis
Published online by Cambridge University Press:

23 November 2012, pp. 952-953
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

High Speed High Resolution pnCCDs and SDDs for Micro Fluorescence Analysis
H. Soltau, R. Hartmann, P. Holl, S. Ihle, P. Lechner, C. Thamm, A. Niculae, I. Ordavo, R. Eckhardt, O. Scharf, F. Schopper, L. Strüder
Published online by Cambridge University Press:

23 November 2012, pp. 954-955
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Application of micro-XRF in forensic science
S. Mamedov
Published online by Cambridge University Press:

23 November 2012, pp. 956-957
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Portable XRF and Raman Analysis of a ‘Modigliani’ Signature Painting
G. Casuccio, K. Bunker, S. Kennedy, M. Sparrow, B. Pacolay, P. Ioannidis, R. Foulke
Published online by Cambridge University Press:

23 November 2012, pp. 958-959
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Thickness and Composition Analysis of Thin-Film Solar Cells Using Micro-XRF
A. Lee
Published online by Cambridge University Press:

23 November 2012, pp. 960-961
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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Proceedings of Microscopy & Microanalysis 2012

Instrumentation Symposium

Surface and Subsurface Analysis-08

Research Article

Advances in Atomic Force Microscopy, from Compositional Mapping to Quantitative Measurements

How to Obtain Rigidity Modulus of Biological Cells Using AFM

New Applications in Atom Probe Tomography

Atom Probe Tomography Analysis of Grain Boundaries in CdTe

Latest developments on NanoSIMS instrumentation for life science and materials

Characterization of Fine Surface Structure with a New Electron Detection System in FE-SEM

Crystallographic Image Processing for Scanning Probe Microscopes

Applying an Atomic Force Microscopy in the Study of Sulfide Flotation

Micro X-Ray Fluorescence-01

Research Article

Characteristics in valence-band emission spectra of simple metals and transition metals obtained by SXES-TEM

Defining a minimum analytical mass in geological reference samples using μXRF mapping capacity

Prediction of Detection Limits of Micro X-Ray Fluorescence (μXRF)

A Flexible Cryojet-Cooled X-ray Fluorescence Microprobe: Initial Results

Rapid elemental distributions with high sensitivity by µ-XRF M.Haschke1, U.Waldschläger1, R.Tagle1, U.Rossek1 1 Bruker Nano GmbH, Berlin, Germany

Micro X-Ray Fluorescence-02

Research Article

Multivariate Statistical Analysis Strategies of μ-XRF Spectral Images

Time Reduction Strategies in Large Area µXRF Imaging

Applications of Micro X-Ray Fluorescence in Concrete

High Speed High Resolution pnCCDs and SDDs for Micro Fluorescence Analysis

Micro X-Ray Fluorescence-03

Research Article

Application of micro-XRF in forensic science

Portable XRF and Raman Analysis of a ‘Modigliani’ Signature Painting

Thickness and Composition Analysis of Thin-Film Solar Cells Using Micro-XRF

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2012

Instrumentation Symposium

Surface and Subsurface Analysis-08

Research Article

Micro X-Ray Fluorescence-01

Research Article

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Research Article

Micro X-Ray Fluorescence-03

Research Article