Microscopy and Microanalysis: Volume 18 - Proceedings of Microscopy & Microanalysis 2012

Simultaneous Atomic Force and Confocal Fluorescence Microscopy for Correlated Nanometer Topographical and Optical Resolution
O. Schulz, A. Ward, R. Ros, Z. Zhao , Y. Liu, H. Yan
Published online by Cambridge University Press:

23 November 2012, pp. 882-883
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Atomic force microscopy and Kelvin probe force microscopy to study the mechanism of amyloid fibril formation and toxicity.
E. Drolle, F. Hane, Y. Choi, R. Gaikwad, S. Attwood, Z. Leonenko
Published online by Cambridge University Press:

23 November 2012, pp. 884-885
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

In-situ ion scattering surface characterization of nanostructured materials exposed to controlled irradiation fields
J. Allain, O. El-Atwani, A. Suslova, J. Fowler, C. Taylor
Published online by Cambridge University Press:

23 November 2012, pp. 886-887
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Combined SIMS-SPM Instrument For High Sensitivity And High Resolution Elemental 3D Analysis
T. Wirtz, Y. Fleming, U. Gysin, T. Glatzel, E. Meyer, U. Maier, U. Wegmann
Published online by Cambridge University Press:

23 November 2012, pp. 888-889
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

A multi-technique approach to the characterization of surfaces and thin films
T. Nunney, M. Wall, P. Camus
Published online by Cambridge University Press:

23 November 2012, pp. 890-891
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Contribution of the surface contamination at room temperature on the quantitative analysis by EPMA of uranium compounds
O. Dugne, E. Brackx, C. Rado, C. Gueneau, S. Chatain, C. Merlet, P. Chamelot, M. Gibilaro, M. Cabiè, M. Lahaye
Published online by Cambridge University Press:

23 November 2012, pp. 892-893
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Advances in Imaging the Chemical State of the Sample Surface with XPS
C. Moffitt, D. Surman, A. Roberts, S. Hutton
Published online by Cambridge University Press:

23 November 2012, pp. 894-895
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Surface Analysis Meets Microscopy: Chemical Changes in Matisse Paintings
R.L. Opila, J. Church, F. Fang, J.L. Mass
Published online by Cambridge University Press:

23 November 2012, pp. 896-897
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Design of Ambient Pressure XPS (AP-XPS) Using Bench-Top X-Ray Source and High-Pressure High-Temperature STM and Applications to Operando Studies of Catalysis
F. Tao
Published online by Cambridge University Press:

23 November 2012, pp. 898-899
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Scanning Auger Analysis of Nanowires and Thin Film Nanostructures
J.S. Hammond, D.F. Paul
Published online by Cambridge University Press:

23 November 2012, pp. 900-901
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

New Desorption Mass Spectrometry Approaches for Inorganic Particle Analysis
C. Szakal, A.R. Konicek, M. Ugelow, D. Simons, R.D. Holbrook
Published online by Cambridge University Press:

23 November 2012, pp. 902-903
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Novel Cluster Ion Beams For Secondary Ion Generation, Sputtering And FIB/SIMS Application
F. Kollmer, D. Rading, R. Moellers, H. Cramer, W. Paul, E. Niehuis
Published online by Cambridge University Press:

23 November 2012, pp. 904-905
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Surface chemistry of Al(CH3)3 and TiCl4 on GaAs(100) and InGaAs during the first half-cycle of atomic layer deposition
B. Granados, F. Lie, A. Muscat
Published online by Cambridge University Press:

23 November 2012, pp. 906-907
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Synchrotron-Based Fourier Transform Infrared Chemical Imaging: Opportunities for Polymer Research
M. Unger, C. Hirschmugl
Published online by Cambridge University Press:

23 November 2012, pp. 908-909
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Atom Probe Tomography for Surface and Near-Surface Applications
T.F. Kelly, D.P. Olson, D. Reinhard, I. Martin, D. Lawrence, T.J. Prosa, D.J. Larson
Published online by Cambridge University Press:

23 November 2012, pp. 910-911
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Characterization of embedded metallic nanoparticles in oxides by cross-coupling aberration-corrected STEM and Atom Probe Tomography
A. Devaraj, R. Colby, V. Shutthanandan, V. Subramanian, C. Wang, D.E. Perea, S. Thevuthasan
Published online by Cambridge University Press:

23 November 2012, pp. 912-913
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Detection and analysis of the native oxide layer and material transfer on the near apex region of atomic force microscope tips using atom probe tomography
C. Tourek, S. Sundararajan
Published online by Cambridge University Press:

23 November 2012, pp. 914-915
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Frequency Modulated Kelvin Probe Force Microscopy to map surface potential of mixed lipid monolayers with and without cholesterol
R. Gaikwad
Published online by Cambridge University Press:

23 November 2012, pp. 916-917
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Enhanced Surface and In-Depth Characterization of Organic and Inorganic Materials Using XPS and Soft Depth Profiling with Argon Cluster Ion Beams
B.R. Strohmeier, R.G. White, T.S. Nunney, P. Mack, A.E. Wright
Published online by Cambridge University Press:

23 November 2012, pp. 918-919
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Analysis of polymer surface structures with X-ray photoelectron spectroscopic imaging
T. Nunney, R. White, P. Mack, A. Wright
Published online by Cambridge University Press:

23 November 2012, pp. 920-921
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2012

Instrumentation Symposium

Surface and Subsurface Analysis-03

Research Article

Simultaneous Atomic Force and Confocal Fluorescence Microscopy for Correlated Nanometer Topographical and Optical Resolution

Atomic force microscopy and Kelvin probe force microscopy to study the mechanism of amyloid fibril formation and toxicity.

Surface and Subsurface Analysis-04

Research Article

In-situ ion scattering surface characterization of nanostructured materials exposed to controlled irradiation fields

Combined SIMS-SPM Instrument For High Sensitivity And High Resolution Elemental 3D Analysis

A multi-technique approach to the characterization of surfaces and thin films

Contribution of the surface contamination at room temperature on the quantitative analysis by EPMA of uranium compounds

Surface and Subsurface Analysis-05

Research Article

Advances in Imaging the Chemical State of the Sample Surface with XPS

Surface Analysis Meets Microscopy: Chemical Changes in Matisse Paintings

Design of Ambient Pressure XPS (AP-XPS) Using Bench-Top X-Ray Source and High-Pressure High-Temperature STM and Applications to Operando Studies of Catalysis

Surface and Subsurface Analysis-06

Research Article

Scanning Auger Analysis of Nanowires and Thin Film Nanostructures

New Desorption Mass Spectrometry Approaches for Inorganic Particle Analysis

Novel Cluster Ion Beams For Secondary Ion Generation, Sputtering And FIB/SIMS Application

Surface and Subsurface Analysis-07

Research Article

Surface chemistry of Al(CH3)3 and TiCl4 on GaAs(100) and InGaAs during the first half-cycle of atomic layer deposition

Synchrotron-Based Fourier Transform Infrared Chemical Imaging: Opportunities for Polymer Research

Atom Probe Tomography for Surface and Near-Surface Applications

Surface and Subsurface Analysis-08

Research Article

Characterization of embedded metallic nanoparticles in oxides by cross-coupling aberration-corrected STEM and Atom Probe Tomography

Detection and analysis of the native oxide layer and material transfer on the near apex region of atomic force microscope tips using atom probe tomography

Frequency Modulated Kelvin Probe Force Microscopy to map surface potential of mixed lipid monolayers with and without cholesterol

Enhanced Surface and In-Depth Characterization of Organic and Inorganic Materials Using XPS and Soft Depth Profiling with Argon Cluster Ion Beams

Analysis of polymer surface structures with X-ray photoelectron spectroscopic imaging

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2012

Instrumentation Symposium

Surface and Subsurface Analysis-03

Research Article

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Surface and Subsurface Analysis-05

Research Article

Surface and Subsurface Analysis-06

Research Article

Surface and Subsurface Analysis-07

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Surface and Subsurface Analysis-08

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