Microscopy and Microanalysis: Volume 18 - Proceedings of Microscopy & Microanalysis 2012

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Proceedings of Microscopy & Microanalysis 2012

Volume 18 - Issue S2 - July 2012

Contents

Page 16 of 50

Instrumentation Symposium

Laser Mediated Processes for High-Contrast, High-Resolution, Ultrafast and In-situ TEM-04

Research Article

Ultrafast Imaging of Rapid Alloy Solidification in Al-Cu Thin Films
J.T. McKeown, T. LaGrange, B.W. Reed, G.H. Campbell, A. Kulovits, J. Wiezorek
Published online by Cambridge University Press:

23 November 2012, pp. 602-603
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Nanosecond-scale imaging of laser-induced crystallization of GeTe
M. Santala, B. Reed, T. LaGrange, G. Campbell, T. Topuria, S. Raoux
Published online by Cambridge University Press:

23 November 2012, pp. 604-605
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Focused Ion Beam Instrumentation & Applications for Physical and Biological Sciences-01

Research Article

Focused Ion Beam Milled Nanochannels for Confinement Enabled DNA Single-Molecule Studies
L. Menard, J. Zhou, M. Woodson, C. Mair, J. Alarie, J. Ramsey
Published online by Cambridge University Press:

23 November 2012, pp. 606-607
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Advantages of Focused Ion Beam to Understand Redeposition, Secondary Sputtering Effects and to Create Microfluidic Structures
L. Saraf, D. Britt
Published online by Cambridge University Press:

23 November 2012, pp. 608-609
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Fabication of GaN islands at specific locations on Si substrates using FIB induced Ga surface precipitation and plasma nitridation
H. Wang, J. Gray
Published online by Cambridge University Press:

23 November 2012, pp. 610-611
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Focused Ion Beam Lithography of Nanophotonic Structures
J.E. Sanabia, A. Nadzeyka, S. Bauerdick, L. Peto, F. Nouvertné
Published online by Cambridge University Press:

23 November 2012, pp. 612-613
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

3D Characterization of Pigment Dispersion in Dried Paint Films Using Focused Ion Beam-Scanning Electron Microscopy
J. Lin, W. Heeschen, J. Reffner, J. Hook
Published online by Cambridge University Press:

23 November 2012, pp. 614-615
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Focused Ion Beam Instrumentation & Applications for Physical and Biological Sciences-02

Research Article

Multi-Species Focused Ion Beam Processing for III-V Semiconductor Materials
B.P. Gila, B.R. Appleton, J. Fridmann, J.E. Sanabia, P. Mazarov
Published online by Cambridge University Press:

23 November 2012, pp. 616-617
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

New processes and modules for improvements in beam chemistry
J. Mulders, L. Roussel, D. Wall
Published online by Cambridge University Press:

23 November 2012, pp. 618-619
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

A Method For In-Situ Measurement Of The Film Thickness And Composition Of Films Deposited by Gas Injection In The FIB-SEM
C. Lang, S. Burgess, G. Kerr, P. Statham, C. Hartfield, R. Stierman
Published online by Cambridge University Press:

23 November 2012, pp. 620-621
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Application of FIB/SEM and Argon Ion Milling to the Study of Foliated Fine Grained Organic Rich Rocks
C.H. Sondergeld, M.E. Curtis, C.S. Rai
Published online by Cambridge University Press:

23 November 2012, pp. 622-623
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Focused Ion Beam Instrumentation & Applications for Physical and Biological Sciences-03

Research Article

Mixed Synapses as a Testbed for Developing Reagents for Building Connectomes and Synaptomes
E. Rosa-Molinar
Published online by Cambridge University Press:

23 November 2012, pp. 624-625
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Using Cryo FIB-SEM to Study Three-Dimensional Biofilm Structure
T. Chou, Q. Wang, M. Libera, E. Uzunoglu
Published online by Cambridge University Press:

23 November 2012, pp. 626-627
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

3D Microstructural Analyses of Premature Failure of a MoSi2 Heating Element
C. Kong, P. Munroe
Published online by Cambridge University Press:

23 November 2012, pp. 628-629
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Image Segmentation for Advanced Characterization of 3D FIB-SEM Reconstructions
M. Marsh
Published online by Cambridge University Press:

23 November 2012, pp. 630-631
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Focused Ion Beam Instrumentation & Applications for Physical and Biological Sciences-04

Research Article

EXpressLO™ for Fast and Versatile FIB Specimen Preparation
L.A. Giannuzzi
Published online by Cambridge University Press:

23 November 2012, pp. 632-633
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Advanced TEM Sample Preparation Technique using FIB Tilt Stage Method
J. Kim, T. Seong, J. Kim, T. Back, H. Kim, C. Kim
Published online by Cambridge University Press:

23 November 2012, pp. 634-635
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Efficient and Precise Sample Preparation by Combination of Pulsed Laser Ablation and FIB Milling
R. Salzer, H. Stegmann
Published online by Cambridge University Press:

23 November 2012, pp. 636-637
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Combined SEM-FIB-SPM-TOF-EDX-EBSD as a Multifunctional Tool
J. Jiruse, L. Sedlacek, M. Rudolf, V. Friedli, F. Oestlund, J. Whitby
Published online by Cambridge University Press:

23 November 2012, pp. 638-639
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

On-line Scanned Probe Microscopy Transparently Integrated with Dual Beam SEM/FIB Systems
A. Ignatov, A. Komissar, R. Geurts
Published online by Cambridge University Press:

23 November 2012, pp. 640-641
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Page 16 of 50

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2012

Instrumentation Symposium

Laser Mediated Processes for High-Contrast, High-Resolution, Ultrafast and In-situ TEM-04

Research Article

Ultrafast Imaging of Rapid Alloy Solidification in Al-Cu Thin Films

Nanosecond-scale imaging of laser-induced crystallization of GeTe

Focused Ion Beam Instrumentation & Applications for Physical and Biological Sciences-01

Research Article

Focused Ion Beam Milled Nanochannels for Confinement Enabled DNA Single-Molecule Studies

Advantages of Focused Ion Beam to Understand Redeposition, Secondary Sputtering Effects and to Create Microfluidic Structures

Fabication of GaN islands at specific locations on Si substrates using FIB induced Ga surface precipitation and plasma nitridation

Focused Ion Beam Lithography of Nanophotonic Structures

3D Characterization of Pigment Dispersion in Dried Paint Films Using Focused Ion Beam-Scanning Electron Microscopy

Focused Ion Beam Instrumentation & Applications for Physical and Biological Sciences-02

Research Article

Multi-Species Focused Ion Beam Processing for III-V Semiconductor Materials

New processes and modules for improvements in beam chemistry

A Method For In-Situ Measurement Of The Film Thickness And Composition Of Films Deposited by Gas Injection In The FIB-SEM

Application of FIB/SEM and Argon Ion Milling to the Study of Foliated Fine Grained Organic Rich Rocks

Focused Ion Beam Instrumentation & Applications for Physical and Biological Sciences-03

Research Article

Mixed Synapses as a Testbed for Developing Reagents for Building Connectomes and Synaptomes

Using Cryo FIB-SEM to Study Three-Dimensional Biofilm Structure

3D Microstructural Analyses of Premature Failure of a MoSi2 Heating Element

Image Segmentation for Advanced Characterization of 3D FIB-SEM Reconstructions

Focused Ion Beam Instrumentation & Applications for Physical and Biological Sciences-04

Research Article

EXpressLO™ for Fast and Versatile FIB Specimen Preparation

Advanced TEM Sample Preparation Technique using FIB Tilt Stage Method

Efficient and Precise Sample Preparation by Combination of Pulsed Laser Ablation and FIB Milling

Combined SEM-FIB-SPM-TOF-EDX-EBSD as a Multifunctional Tool

On-line Scanned Probe Microscopy Transparently Integrated with Dual Beam SEM/FIB Systems

Microscopy and Microanalysis

Refine listing

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Proceedings of Microscopy & Microanalysis 2012

Instrumentation Symposium

Laser Mediated Processes for High-Contrast, High-Resolution, Ultrafast and In-situ TEM-04

Research Article

Focused Ion Beam Instrumentation & Applications for Physical and Biological Sciences-01

Research Article

Focused Ion Beam Instrumentation & Applications for Physical and Biological Sciences-02

Research Article

Focused Ion Beam Instrumentation & Applications for Physical and Biological Sciences-03

Research Article

Focused Ion Beam Instrumentation & Applications for Physical and Biological Sciences-04

Research Article