Microscopy and Microanalysis: Volume 18 - Proceedings of Microscopy & Microanalysis 2012

Properties and Behavior of Amorphous Carbon Films Related to Phase Plate Applications
R. Danev, R. Glaeser, B. Buijsse
Published online by Cambridge University Press:

23 November 2012, pp. 482-483
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Practical hole-free phase plate imaging: principles, advantages and pitfalls
M. Malac, M. Bergen, R. Egerton, M. Kawasaki, M. Beleggia, H. Furukawa, M. Shimizu
Published online by Cambridge University Press:

23 November 2012, pp. 484-485
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Automatic Phase-Plate Centering for Cryo-TEM
M. Marko, A. Leith
Published online by Cambridge University Press:

23 November 2012, pp. 486-487
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Silicon/Chromium based thin films -a way to Zernike phase plates with long-term stability?
S.H. Irsen, J. Lenz, S. Patai, P. Kurth
Published online by Cambridge University Press:

23 November 2012, pp. 488-489
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Microfabricated Zernike Phase Plates for Cryo-TEM
C. Striemer, T. Gaborski, J. Roussie, M. Marko, C. Hsieh, X. Meng
Published online by Cambridge University Press:

23 November 2012, pp. 490-491
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Aberration Corrected Zernike Phase Contrast TEM
H. Iijima, S. Motoki, F. Hosokawa, Y. Ohkura
Published online by Cambridge University Press:

23 November 2012, pp. 492-493
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

A quadrupole optics with large aspect ratio for an anamorphotic electrostatic phase plate without beam blocking
H. Müller, M. Haider, V. Gerheim, J. Zach
Published online by Cambridge University Press:

23 November 2012, pp. 494-495
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

A Nanocrystalline Hilbert-Phase Plate for Phase-Contrast Transmission Electron Microscopy of Amorphous Objects
D. Manuel, B. Gamm, H. Simon, E. Müller, W. Send, D. Gerthsen, A. Rosenauer
Published online by Cambridge University Press:

23 November 2012, pp. 496-497
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Application of Zernike Phase-Contrast Electron Microscopy and Electron Tomography for Frozen Hydrated Complex Biological Specimens
Y. Fukuda, R. Danev, K. Nagayama
Published online by Cambridge University Press:

23 November 2012, pp. 498-499
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Study for Automated Imaging with Phase Plate Electron Microscopy and Suggestions for the Future Instrumentation
H. Qian, H. Furukawa, M. Shimizu, M. Kawasaki, M. Shiojiri
Published online by Cambridge University Press:

23 November 2012, pp. 500-501
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Electron Ptychography: Applications Of The Electron Wave Phase
M.C. Sarahan, B. Kraus, M.J. Humphry, A.M. Maiden, J.M. Rodenburg
Published online by Cambridge University Press:

23 November 2012, pp. 502-503
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Modular Nano-Positioning System for Phase Plates
S.H. Irsen, P. Kurth
Published online by Cambridge University Press:

23 November 2012, pp. 504-505
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Coherent electron interference of satellite reflections
R.A. Herring, K. Saitoh, N. Tanaka, T. Tanji
Published online by Cambridge University Press:

23 November 2012, pp. 506-507
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Twin-Foucault Imaging for Observing 180-degree Domains in Magnetic Materials
K. Harada
Published online by Cambridge University Press:

23 November 2012, pp. 508-509
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Measuring the Magnetic Induction of Isolated CoFeB Nanowires by Off-Axis Electron Holography
A. Akhtari-Zavareh, K. Kavanagh, T. Kasama, L. Carignan, A. Yelon, D. Menard, R. Herring, R. Dunin-Borkowski, M. McCartney
Published online by Cambridge University Press:

23 November 2012, pp. 510-511
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Semi-Quantitative TEM Characterization of ReS2 Nanoparticles
C. Kliewer, T. Ho, J. McConnachie
Published online by Cambridge University Press:

23 November 2012, pp. 512-513
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Atomistic Structure Analysis Of 3C-SiC/Si(001) Interface And Stacking Faults By Aberration-Corrected Transmission Electron Microscopy
J. Yamasaki, N. Tanaka, S. Inamoto, Y. Nomura, K. Okazaki-Maeda
Published online by Cambridge University Press:

23 November 2012, pp. 514-515
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Large volume, non-destructive 3D analysis of low-density materials and interfaces with phase contrast X-ray microscopy
J. Gelb, B. Hornberger, C. Holzner, A. Merkle, M. Feser, W. Yun
Published online by Cambridge University Press:

23 November 2012, pp. 516-517
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Development and application of a novel characterization system to quantify grain structures of nickel superalloys in 3D
M. Uchic, M. Groeber, P. Callahan, M. Shah, A. Shiveley
Published online by Cambridge University Press:

23 November 2012, pp. 518-519
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Advanced analysis of 3D EBSD data obtained from FIB-EBSD tomography
S. Zaefferer, P. Konijnenberg
Published online by Cambridge University Press:

23 November 2012, pp. 520-521
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2012

Instrumentation Symposium

TEM Phase Contrast Imaging in Biological and Materials Science-04

Research Article

Properties and Behavior of Amorphous Carbon Films Related to Phase Plate Applications

Practical hole-free phase plate imaging: principles, advantages and pitfalls

Automatic Phase-Plate Centering for Cryo-TEM

TEM Phase Contrast Imaging in Biological and Materials Science-05

Research Article

Silicon/Chromium based thin films -a way to Zernike phase plates with long-term stability?

Microfabricated Zernike Phase Plates for Cryo-TEM

Aberration Corrected Zernike Phase Contrast TEM

A quadrupole optics with large aspect ratio for an anamorphotic electrostatic phase plate without beam blocking

TEM Phase Contrast Imaging in Biological and Materials Science-06

Research Article

A Nanocrystalline Hilbert-Phase Plate for Phase-Contrast Transmission Electron Microscopy of Amorphous Objects

Application of Zernike Phase-Contrast Electron Microscopy and Electron Tomography for Frozen Hydrated Complex Biological Specimens

Study for Automated Imaging with Phase Plate Electron Microscopy and Suggestions for the Future Instrumentation

Electron Ptychography: Applications Of The Electron Wave Phase

Modular Nano-Positioning System for Phase Plates

Coherent electron interference of satellite reflections

Twin-Foucault Imaging for Observing 180-degree Domains in Magnetic Materials

Measuring the Magnetic Induction of Isolated CoFeB Nanowires by Off-Axis Electron Holography

Semi-Quantitative TEM Characterization of ReS2 Nanoparticles

Atomistic Structure Analysis Of 3C-SiC/Si(001) Interface And Stacking Faults By Aberration-Corrected Transmission Electron Microscopy

Large volume, non-destructive 3D analysis of low-density materials and interfaces with phase contrast X-ray microscopy

3D Structure Determination in Physical and Biological Sciences-01

Research Article

Development and application of a novel characterization system to quantify grain structures of nickel superalloys in 3D

Advanced analysis of 3D EBSD data obtained from FIB-EBSD tomography

Microscopy and Microanalysis

Refine listing

Actions for selected content:

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Proceedings of Microscopy & Microanalysis 2012

Instrumentation Symposium

TEM Phase Contrast Imaging in Biological and Materials Science-04

Research Article

TEM Phase Contrast Imaging in Biological and Materials Science-05

Research Article

TEM Phase Contrast Imaging in Biological and Materials Science-06

Research Article

3D Structure Determination in Physical and Biological Sciences-01

Research Article