Microscopy and Microanalysis: Volume 16 - Issue S2

Nanostructural Correlation between Layers in a Magnetic Recording Medium
F Hossein-Babaei, R Sinclair
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01 August 2010, pp. 1522-1523
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Atomic Resolution Grain Boundary Analysis Using Atom Probe Tomography
PJ Felfer, SP Ringer, JM Cairney
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01 August 2010, pp. 1524-1525
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Correlating Interfacial Structure and Magnetism in Fe-MgO Thin Films Using Electron Microscopy, Neutron Reflectometry, and Atom Probe Tomography
SR Spurgeon, CR Winkler, BJ Kirby, CL Johnson, DN Seidman, ML Taheri
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01 August 2010, pp. 1526-1527
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

A Fast Approach to Quantitative Evaluation of Minerals by Scanning Electron Microscopy – Application to Diverse Natural Materials and Metallurgy
A Azenkeng, K Eylands, P Kleven
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01 August 2010, pp. 1528-1529
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Advanced Structural and Chemical Analysis of Materials for Energy Related Applications
ML Trudeau, AM Serventi, K Zaghib, R Veillette, L Rodrigue, D Thibault
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01 August 2010, pp. 1530-1531
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Si+ Implantation into SiO2 Layers and Ion Beam Mixing in SiO2/Si Interfaces
H-J Fittinga, DA Zatsepin
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01 August 2010, pp. 1532-1533
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Zero-Loss/Deflection Map Analysis
P Fraundorf, K Pisane, E Mandell, R Collins
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01 August 2010, pp. 1534-1535
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

High Sensitivity EFTEM Elemental Mapping with unlimited Acquisition Time
S Wang
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01 August 2010, pp. 1536-1537
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

TEM Study of Mechanically Alloyed and Hot Extruded Aluminum Composite Reinforced with Graphite
JL Hernández, RM Sánchez, JJ Cruz, C Ornelas, C Elías
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01 August 2010, pp. 1538-1539
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

A Simple Method to Measure Graphite Thickness with Monolayer Precision Using Plasmon Energy Loss Imaging
M Boese, S Kumar, A O'Neill, M Lotya, HZ Zhang, JN Coleman, GS Duesberg
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01 August 2010, pp. 1540-1541
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Investigation of Radiolytic Effects in Frozen Aqueous Specimens by Electron Energy Loss Spectroscopy
MA Aronova, AA Sousa, RD Leapman
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01 August 2010, pp. 1542-1543
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Electron-Loss Near-Edge Structure (ELNES) of BaTiO3
V Gallegos-Orozco, E García-Sánchez, JM Cervantes-V., P de Lira-Gómez, F Espinosa-Magaña, A Santos-Beltrán
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01 August 2010, pp. 1544-1545
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

EELS Characterization of Patterned Low-k Materials
Y Otsuka, Y Shimizu, N Kawasaki, K Kurushima, S Ogawa
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01 August 2010, pp. 1546-1547
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Electron Energy Loss Spectroscopy of Thermochromic V2O5
D Carillo-Flores, M Ochoa-Lara, F Espinosa-Magaña
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01 August 2010, pp. 1548-1549
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Hybrid Structures of NiTi and Carbon Nanotubes
KA Juggernauth, K Sun, JG Ok, AJ Hart, S Daly
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01 August 2010, pp. 1550-1551
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Correlating Nanostructure and Activity in Cu/TiO2 Photocatalyst
C Leyva, PA Crozier
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01 August 2010, pp. 1552-1553
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

The Catalytic Role of Vanadium in Mg Nanostructures for Hydrogen Storage
J Fan, Y He, Y Zhao
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01 August 2010, pp. 1554-1555
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

An Integrated Approach to Characterizing ZnO Nanostructures by Thin-film XRD Techniques and SEM
N Nag, J Liu
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01 August 2010, pp. 1556-1557
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Towards Non-Destructive Burgers Vector Identification of Dislocations in Electronic Materials via Electron Channeling Contrast Imaging
RJ Kamaladasa, ME Twigg, M De Graef, YN Picard
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01 August 2010, pp. 1558-1559
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Microcharacterization of Tribo Layers on Al–Steel
SJ Lingala, R Sharghi-Moshatghin, D Jayne, F Ernst
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01 August 2010, pp. 1560-1561
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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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Volume 16 - Supplement S2 - July 2010

Physical Sciences Symposia

Imaging and Spectroscopy of Interfaces and Surfaces in Advanced Materials and Nanostructures

Abstract

Nanostructural Correlation between Layers in a Magnetic Recording Medium

Atomic Resolution Grain Boundary Analysis Using Atom Probe Tomography

Correlating Interfacial Structure and Magnetism in Fe-MgO Thin Films Using Electron Microscopy, Neutron Reflectometry, and Atom Probe Tomography

A Fast Approach to Quantitative Evaluation of Minerals by Scanning Electron Microscopy – Application to Diverse Natural Materials and Metallurgy

Advanced Structural and Chemical Analysis of Materials for Energy Related Applications

Si+ Implantation into SiO2 Layers and Ion Beam Mixing in SiO2/Si Interfaces

Zero-Loss/Deflection Map Analysis

High Sensitivity EFTEM Elemental Mapping with unlimited Acquisition Time

TEM Study of Mechanically Alloyed and Hot Extruded Aluminum Composite Reinforced with Graphite

A Simple Method to Measure Graphite Thickness with Monolayer Precision Using Plasmon Energy Loss Imaging

Investigation of Radiolytic Effects in Frozen Aqueous Specimens by Electron Energy Loss Spectroscopy

Electron-Loss Near-Edge Structure (ELNES) of BaTiO3

EELS Characterization of Patterned Low-k Materials

Electron Energy Loss Spectroscopy of Thermochromic V2O5

Hybrid Structures of NiTi and Carbon Nanotubes

Correlating Nanostructure and Activity in Cu/TiO2 Photocatalyst

The Catalytic Role of Vanadium in Mg Nanostructures for Hydrogen Storage

An Integrated Approach to Characterizing ZnO Nanostructures by Thin-film XRD Techniques and SEM

Towards Non-Destructive Burgers Vector Identification of Dislocations in Electronic Materials via Electron Channeling Contrast Imaging

Microcharacterization of Tribo Layers on Al–Steel

Microscopy and Microanalysis

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Volume 16 - Supplement S2 - July 2010

Physical Sciences Symposia

Imaging and Spectroscopy of Interfaces and Surfaces in Advanced Materials and Nanostructures

Abstract