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Volume 16 - Supplement S2 - July 2010

Contents

Page 37 of 50

Physical Sciences Symposia

Imaging and Spectroscopy of Interfaces and Surfaces in Advanced Materials and Nanostructures

Abstract

  • Correlation between Atomic Structure and Superglide of an Incommensurate Grain Boundary in Au

  • U Dahmen, T Radetic, J Ye, AM Minor, D Caliste, F Lancon
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1442-1443
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Electron Microscopy Study of interfaces of Proton Conducting Fuel Cell Anodes

  • DM Kepaptsoglou, QM Ramasse, M Sunding, S Diplas, T Norby, A Gunnæs
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1444-1445
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Atomic-Resolution Characterization of Oxide-Metal Interfaces in Pt Precipitates in Sapphire Annealed at 1600°C

  • MK Santala, VR Radmilovic, R Giulian, MC Ridgway, AM Glaeser, R Gronsky
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1448-1449
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Influence of Microstructure on the Optical Quality of Silicon Carbide Films: A TEM Study

  • S Rajasekhara, B Neuner III, G Shvets, PJ Ferreira, D Kovar
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1450-1451
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Single Atom Motion on CeO2 Nanoparticle Surfaces Imaged by Aberration Corrected HRTEM

  • G Möbus, Z Saghi
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1452-1453
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Cs-corrected STEM Study of Structure and Chemistry of Au/Ni/GaAs, Au/Cu/CdTe and Pt/YSZ Interfaces

  • K Sun
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1456-1457
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Determination of Local Oxidations States in Ni-NiO Core-shell Structures Using White Line Intensity Ratios

  • SM Weil, J Wang, JB Tracy, K van Benthem
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1458-1459
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • HRTEM and STEM Study of Interfaces in FePt/CoCrPt/MgO Structure for Perpendicular Magnetic Recording

  • J-G Zheng, Z Xu, SM Zhou, S Xie, DG Wei, Z Mao
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1460-1461
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Atomic Level Mechanisms of Solid-State Dewetting in Thin Metal Films Deposited on Silicon (100) Substrates

  • AM Thron, P Greene, K Liu, K van Benthem
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1462-1463
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Preparation and Characterization of Pt/γ-Al2O3 Model Catalyst on NiAl Alloy

  • Z Zhang, L Li, L Wang, S Sanchez, R Grieshaber, Q Wang, D Johnson, AI Frenkel, R Nuzzo, J Yang
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1464-1465
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Naturally-Formed Nanoscale Phase Separation in Epitaxially-Grown III-V Semiconductor Alloys

  • M Ishimaru, YT Tanaka, S Hasegawa, H Asahi, K Sato, T Konno
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1470-1471
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Towards Quantitative Analysis of STEM Image Contrast of Interfaces and Surfaces

  • S Stemmer, JM LeBeau, SD Findlay, AJ D'Alfonso, LJ Allen
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1472-1473
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Atomic and Electronic Structure of Polar Fe2O3/MgO Interface

  • K Pande, VK Lazarov, M Weinert, M Gajdardziska-Josifovska
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1474-1475
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Local Lattice Strain Measurement using Geometric Phase Analysis of Annular Dark Field Images from Scanning Transmission Electron Microscopy

  • J Chung, G Lian, L Rabenberg
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1476-1477
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Quantitative Analysis of Crystal Defects: Towards 3-Dimensional Imaging of Charge Densities and Atomic Structure by Inline Electron Holography

  • CT Koch
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1478-1479
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Effects of Lattice Spacing on Strain Analysis using Phase Technique

  • WJ Chang, TD Brown
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1480-1481
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Page 37 of 50