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A Simple Method to Measure Graphite Thickness with Monolayer Precision Using Plasmon Energy Loss Imaging

Published online by Cambridge University Press:  01 August 2010

M Boese ,
S Kumar ,
A O'Neill ,
M Lotya ,
HZ Zhang ,
JN Coleman  and
GS Duesberg
M Boese
Affiliation:
Trinity College, Ireland
S Kumar
Affiliation:
Trinity College, Ireland
A O'Neill
Affiliation:
Trinity College, Ireland
M Lotya
Affiliation:
Trinity College, Ireland
HZ Zhang
Affiliation:
Trinity College, Ireland
JN Coleman
Affiliation:
Trinity College, Ireland
GS Duesberg
Affiliation:
Trinity College, Ireland

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1540 - 1541
Copyright
Copyright © Microscopy Society of America 2010