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Volume 16 - Supplement S2 - July 2010

Contents

Page 38 of 50

Physical Sciences Symposia

Imaging and Spectroscopy of Interfaces and Surfaces in Advanced Materials and Nanostructures

Abstract

  • Quantitative Analysis of Graphene Folded Edges Using Electron Diffraction

  • J Zhang, J Xiao, X Meng, C Monroe, Y Huang, J Zuo
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1482-1483
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Mechanisms of Enhanced Phonon Scattering in Nanostructured PbTe Based Thermoelectric Materials

  • J He, JR Sootsman, S Girard, MG Kanatzidis, VP Dravid
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1484-1485
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Microscopy of the Spinel-Forming Reaction with Nanoparticles

  • JP Winterstein, M Sezen, A Rečnik, CB Carter
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1486-1487
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • TEM Investigations of Amorphous Calcium Carbonate Formation in Seawater

  • SG McMurray, BP Gorman
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1488-1489
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Boron Enrichment and Phase Formation at TiN Twin Boundaries

  • C Scheu, D Hochauer, J Wagner, V Srot, K Jurkschat, N Grobert, C Mitterer
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1490-1491
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • The Precipitation of Sb2Te3 via Intermediate Phases in the Thermoelectric Ag-Sb-Te System

  • JD Sugar, PA Sharma, DL Medlin
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1492-1493
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Effect of TiO2 Nanotube Structure on Photocatalytic Production of Methane

  • S Santra, C Leyva-Porras, PA Crozier
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1494-1495
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • TEM Investigation of Er2O3 Thin Films Grown on Si (100) by Laser MBE

  • YL Zhu, X Wang, M He, HB Lu, XL Ma
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1496-1497
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Gold Catalyzed Growth of Three-dimensional Hierarchical ZnO Nanobelts

  • H Liu, D Tang, J Liu
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1498-1499
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • PENEPMA, a Useful Tool in Intermetallic Phase Identification along the Joint Interface of Al-Mg Dissimilar Metal Friction Stir Welds

  • V Firouzdor, JH Fournelle, S Kou
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1500-1501
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Nano-Scale Lamellar Monoclinic Li2MnO3 Phase with Stacking Disordering in Lithium-Rich and Oxygen-Deficient Li-Mn-O Cathode Materials

  • J Wang, Z Xu, H Zheng, Y Xiong, R Wang, J Gui
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1502-1503
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Thermoelectric and Structural Characterization of InxRh4Sb12 (0 <x< 0.2) Skutterudites

  • J Eilertsen, S Rouvimov, P Plachinda, TJ Hendricks III, M Subramanian
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1504-1505
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Investigation of Elemental Composition and Bonding Structure at the Sb-doped Ni-FUSI/SiO2 interface

  • N Kawasaki, N Sugiyama, Y Otsuka, H Hashimoto
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1506-1507
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Transmission Electron Microscopy Study of Defects in Nanopyramidal InGaN LEDs Structures

  • DN Zakharov, R Colby, IH Wildeson, DA Ewoldt, Z Liang, NJ Zaluzec, RE Garcia, THD Sands, EA Stach
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1508-1509
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Fringe Contrasted Images of Grain Boundaries in Fe81Ga19 Thin Films

  • M Shamsuzzoha
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1510-1511
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • TEM Investigation of Thermal Stability of Au Metallization to SrFeO3/Al2O3 sensing system

  • D Wang, JJ Tunney, ML Post
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1512-1513
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Study of the Rhodium Nanoparticles in ZrO2-CeO2 Based Catalytic Materials using Nano Beam Diffraction and High Resolution TEM

  • H Jiang, J Chen, M Malac
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1514-1515
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • TEM Characterization of GaSb Growth on GaAs (001) Substrate: Growth Mode and Defect Evaluation

  • S Huang, G Balakrishnan, D Huffaker
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1516-1517
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • HAADF STEM and EELS Investigations of Grain Boundaries in SrTiO3

  • KJ Dudeck, M Couillard, DJH Cockayne, GA Botton
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1518-1519
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • The Structure of Strontium Titanate Bi-crystal Grain Boundaries

  • S Dey, JP Buban, ND Browning
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1520-1521
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Page 38 of 50