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Volume 16 - Supplement S2 - July 2010

Contents

Page 40 of 50

Physical Sciences Symposia

Imaging and Spectroscopy of Interfaces and Surfaces in Advanced Materials and Nanostructures

Abstract

  • Conductive Atomic Force Microscopy Study of Doped Tin Oxide Thin Film

  • L Fang, R Korotkov
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1562-1563
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Spatial Identification of Defect Sites in Individual Carbon Nanotubes Using Micro-Raman Spectroscopy

  • D McClain, W Hudson, T Nguyen, J Jiao, K O'Brien
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1564-1565
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Aberration-Corrected Electron Microscopy Studies of Novel Nanostructures in Highly Aligned Nano-twinned Metals

  • K Yoshida, C Shute, ED Boyes, PL Gai, JR Weertman
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1566-1567
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Microscopy and Analysis in Forensic Science

Abstract

  • Microspheres and Spheroids: The Value of the Stereomicroscope in Evaluating Damage and Debris

  • CL Cwiklik
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1568-1569
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Characterization of Pipe Bomb Fragments using Optical Microscopy and Scanning Electron Microscopy

  • MJ Platek, OJ Gregory, T Duarte, J Oxley, J Smith, E Bernier
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1570-1571
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Use of Inkjet Printing Technology to Produce Test Materials for Trace Explosive Analysis

  • E Windsor, G Gillen, M Najarro, A Bloom
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1572-1573
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • NanoSIMS Analysis of Bacillus Spores for Forensics

  • PK Weber, ML Davisson, SP Velsko
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1574-1575
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Cell Wall to Cell: Microscopic Forensic Botany

  • SK Wilson
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1576-1577
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • The Potential Application of EBSD to Serial Number Restoration

  • C Necker, R Forsyth
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1578-1579
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Characterization and Discrimination of Architectural Paint Samples

  • DM Wright, MJ Bradley, AH Mehltretter
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1580-1581
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Microscopic Methods for Analyses of Works of Art and Gemmological Objects in Forensic Science

  • M Kotrlý, I Turková, V Grunwaldová
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1582-1583
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Application of Forensic Science Methodology to Pharmaceutical Investigations

  • AD Vogt, JP Neilly
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1584-1585
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • X-Ray Microanalysis of Art Glass Surfaces

  • RB Simmons
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1586-1587
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Corrosion Products Present in Wood Recovered from a Historic Shipwreck

  • MW Pendleton, G Fox, EA Ellis, BB Pendleton
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1588-1589
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Wavelength Dispersive Spectroscopy Analysis of GSR: a Novel Approach to Firearm Identification

  • MK Garren, SJ Singletary
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1590-1591
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Structural and Chemical Analysis of Materials in the Nuclear Power Industry

Abstract

  • In Situ Observation of Damage Structure in Fe-Cr Alloys by Means of HVEM-Ion Accelerator Facility

  • S Ohnuki, N Hashimoto, H Seto, N Yamaguchi, H Kinoshita, S Watanabe
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1592-1593
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Characterization of Helium Ion Implantation Damage in Metallic Multilayers

  • A Misra, D Bhattacharyya, Q Wei, M Nastasi
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1594-1595
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Variability in Chromium Segregation at Lath Boundaries in Proton-Irradiated 9 wt.% Cr Model Steel Determined by Quantitative X-Ray Mapping

  • KG Field, J Bentley, TR Allen
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1596-1597
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Atom Probe Tomography of Radiation-Induced Precipitation in Reactor Cladding and Structural Steels

  • Z Jiao, GS Was
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1598-1599
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Page 40 of 50