Microscopy and Microanalysis: Volume 25 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Physical Science Symposia

Theory and Applications of Electron Tomography in the Materials Sciences

3D Electron Ptychography

Engineering Chiral Structures Through Strain Release: Electron Tomography Study of Twisted Nanowires

Reconstruction of Projected and 3D Magnetization Distributions from Electron-Optical Phase Images using an Iterative Model-Based Algorithm

Quantification of 3D Atomic Structures and Their Dynamics by Atom-Counting from an ADF STEM Image

Defining Theoretical Limits of Aberration-Corrected Electron Tomography: New Bounds for Resolution, Object Size, and Dose

STEM/EDS Tomography of Cometary Dust

4D Atomic Electron Tomography

Data Acquisition in 4D Atomic Electron Tomography

Characterisation and Categorisation Strategies for Anisotropic Gold Nanoparticles for Applications in Biology

Towards Routine EDX Tomography in Semiconductor Failure Analysis

Structure-dependent Conducting Properties of Phosphonated Polypeptoid Electrolyte Membranes Revealed by Cryogenic Electron Tomography

Shape Determination in Lithium-Ion Battery Cathode Materials Using Electron Diffraction-Assisted Electron Tomography

Three-dimensional Analysis of Non-stained Polymer Alloy Using Differential Phase Contrast-STEM Tomography

In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies

In-situ TEM on Formation of Monatomic Metallic Glasses Through Ultrafast Liquid Quenching

Electric Field-Induced Surface Melting of Gold Observed In Situ at Room Temperature and at Atomic Resolution Using TEM

In situ TEM Investigation of the Electroplasticity Phenomenon in Metals

Microstructure and Defect Characterization Using Advanced STEM Techniques: 4D-STEM and WB DF STEM

Differential Phase Contrast Imaging of the Magnetostructural Transition and Phase Boundary Motion in Uniform and Gradient-doped FeRh-based Thin Films

In Situ Ferroelectric Domain Dynamics Probed with Differential Phase Contrast Imaging

Real-Space Observation of a Transformation from Antiskyrmion to Skyrmion by Lorentz TEM

Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Physical Science Symposia

Theory and Applications of Electron Tomography in the Materials Sciences

In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies