Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-27T12:35:20.038Z Has data issue: false hasContentIssue false

Defining Theoretical Limits of Aberration-Corrected Electron Tomography: New Bounds for Resolution, Object Size, and Dose

Published online by Cambridge University Press:  05 August 2019

Reed Yalisove
Affiliation:
Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, USA.
Suk Hyun Sung
Affiliation:
Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, USA.
Robert Hovden
Affiliation:
Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, USA. Applied Physics Program, University of Michigan, Ann Arbor, MI, USA.

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Theory and Applications of Electron Tomography in the Materials Sciences
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Crowther, R, DeRosier, D and Klug, A, Proc. R. Soc. A 317 (1970), p. 319.Google Scholar
[2]Hegerl, R and Hoppe, W, Zeitschrift für Naturforschung A 31(12) (1976), p. 1717.Google Scholar
[3]Hovden, R et al. , Ultramicroscopy 140 (2014), p. 26.Google Scholar
[4]Intaraprasonk, V, Xin, H and Muller, D, Ultramicroscopy 108 (2008), p. 1454.Google Scholar
[5]Saxberg, B and Saxton, W, Ultramicroscopy 6 (1981), p. 85.Google Scholar