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In Situ Ferroelectric Domain Dynamics Probed with Differential Phase Contrast Imaging

Published online by Cambridge University Press:  05 August 2019

Abinash Kumar ,
Rohan Dhall  and
James M. LeBeau
Abinash Kumar
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC, USA
Rohan Dhall
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
James M. LeBeau*
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC, USA
*
*Corresponding author: [email protected]

Abstract

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Type
In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1838 - 1839
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Li, F. et al. , Nature Materials 17 (2018), p. 349.Google Scholar
[2]Li, F. et al. , Nature Communications 7 (2016), p. 13807.Google Scholar
[3]Takenaka, H. et al. , Nature 546 (2017), p.391.Google Scholar
[4]Shibata, N. et al. , Nature Physics 8 (2012), p. 611.Google Scholar
[5]Sang, X. and LeBeau, J. M., Ultramicroscopy 138 (2014), p.28.Google Scholar
[6]This material is based upon work supported by the National Science Foundation, as part of the Center for Dielectrics and Piezoelectrics under Grant Nos. IIP-1361571 and IIP-1361503.Google Scholar