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Microstructure and Defect Characterization Using Advanced STEM Techniques: 4D-STEM and WB DF STEM

Published online by Cambridge University Press:  05 August 2019

J. Miao
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, USA. Department of Materials Science and Engineering, The Ohio State University, Columbus, USA.
L. Casalena
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, USA. Department of Materials Science and Engineering, The Ohio State University, Columbus, USA.
J. Ciston
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, USA.
T. Pekin
Affiliation:
Institut für Physik, Humboldt-Universität zu Berlin, Berlin, Germany.
M. Ghazisaeidi
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, USA.
M. J. Mills*
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, USA. Department of Materials Science and Engineering, The Ohio State University, Columbus, USA.
*
*Corresponding author: [email protected]

Abstract

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Type
In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Ophus, C et al. , Microscopy and Microanalysis 20 (2014), p. 62.Google Scholar
[2]Ozdol, VB et al. , Applied Physics Letters 106 (2015), p. 253107.Google Scholar
[3]Miao, J et al. , Microscopy and Microanalysis 24 (2018), p. 2202.Google Scholar
[4]Miao, J et al. , Acta Materialia 132 (2017), p. 35.Google Scholar
[5]The authors acknowledge financial support from The National Science Foundation, Division of Materials Research under contract # #DMR-60050072. Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231. JC acknowledges support from the DOE Early Career Research Program.Google Scholar