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Microstructure and Defect Characterization Using Advanced STEM Techniques: 4D-STEM and WB DF STEM
Published online by Cambridge University Press: 05 August 2019
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- Type
- In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
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- Copyright
- Copyright © Microscopy Society of America 2019
References
[5]The authors acknowledge financial support from The National Science Foundation, Division of Materials Research under contract # #DMR-60050072. Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231. JC acknowledges support from the DOE Early Career Research Program.Google Scholar
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