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4D Atomic Electron Tomography

Published online by Cambridge University Press:  05 August 2019

Jianwei Miao ,
Jihan Zhou ,
Yongsoo Yang ,
Yao Yang ,
Dennis S. Kim ,
Andrew Yuan ,
Xuezeng Tian ,
Colin Ophus ,
Fan Sun  and
Andreas K. Schmid
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Jianwei Miao*
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA.
Jihan Zhou
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA.
Yongsoo Yang
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA.
Yao Yang
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA.
Dennis S. Kim
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA.
Andrew Yuan
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA.
Xuezeng Tian
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA, USA.
Colin Ophus
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA.
Fan Sun
Affiliation:
Department of Physics, University at Buffalo, the State University of New York, Buffalo, NY, USA.
Andreas K. Schmid
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA.
Michael Nathanson
Affiliation:
Department of Chemical and Biological Engineering, University of Colorado at Boulder, Boulder, CO, USA.
Hendrik Heinz
Affiliation:
Department of Chemical and Biological Engineering, University of Colorado at Boulder, Boulder, CO, USA.
Qi An
Affiliation:
Chemical and Materials Engineering, University of Nevada, Reno, NV, USA.
Hao Zeng
Affiliation:
Department of Physics, University at Buffalo, the State University of New York, Buffalo, NY, USA.
Peter Ercius
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA.
*
*Corresponding author: [email protected]

Abstract

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Type
Theory and Applications of Electron Tomography in the Materials Sciences
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1814 - 1815
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Miao, J, Ercius, P and Billinge, SJL, Science 353 (2016), p. aaf2157.Google Scholar
[2]Scott, MC et al. , Nature 483 (2012), p. 444.Google Scholar
[3]Chen, CC et al. , Nature 496 (2013), p. 74.Google Scholar
[4]Xu, R et al. , Nature Mater. 14 (2015), p. 1099.Google Scholar
[5]Miao, J, Föster, F and Levi, O, Phys. Rev. B 72 (2005), p. 052103.Google Scholar
[6]Pryor, A Jr. et al. , GENFIRE: Sci. Rep. 7 (2017), p. 10409.Google Scholar
[7]Yang, Y et al. , Nature 542 (2017), p. 75.Google Scholar
[8]Zhou, J et al. , arXiv:1807.10709 (2018).Google Scholar
[9]This work was supported by STROBE: A National Science Foundation Science & Technology Center under Grant No. DMR 1548924, the Office of Basic Energy Sciences of the U.S. DOE (Grant No. DE-SC0010378) and the NSF DMREF program (DMR-1437263). ADF-STEM imaging was performed on TEAM I at the Molecular Foundry, which is supported by the Office of Science, Office of Basic Energy Sciences of the U.S. Department of Energy under Contract No. DE-AC02—05CH11231.Google Scholar