Microscopy and Microanalysis: Volume 25 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Physical Science Symposia

Electron Crystallography of Nano-structures in Nanotechnology, Materials and Bio-Sciences

Revealing Embedded Crystals through their Diffracting Signals in Transmission Electron Microscopy

Microstructure Evolution and Its Effect on Magnetic Properties of Mn-Al Alloy Fabricated via End Milling Machining Process

Advantages of Precession Electron Diffraction in the Study of Small Metallic Nanoparticles

Dynamical Diffraction Calculations of Incommensurate Modulations in Crystals

The 4D Camera: Very High Speed Electron Counting for 4D-STEM

k-Scanning: An Alternative to 4D-STEM

Sub-nm Resolution, Sub-pm Precision Structure Mapping Robust to Thickness and Tilt Variations by Cepstral Analysis of Scanning Nanodiffraction 4D-STEM

Crystallographic symmetry classifications of noisy 2D periodic images in the presence of pseudo-symmetries of the Fedorov type

Decoupling Polarization, Crystal Tilt and Symmetry in Epitaxially-Strained Ferroelectric Thin Films Using 4D-STEM

Advances in the Structure Analysis from Electron Diffraction Data: Determination of Absolute Structure of Chiral Molecules

Multidimensional Electron Diffraction-Microscopy of Cabotegravir Nanocrystals

4D-STEM Pair Distribution Function Mapping of the Morphology and Structure of Amorphous Organic Materials

In Situ Electron Diffraction using Liquid-Electrochemical TEM for Monitoring Structural Transformation in Single Crystals Of Cathode Materials for Li-Ion Batteries

Electron Crystallography in the Age of Pixelated Detectors: From Crystalline/Amorphous Organic Structural Models and Phase Mapping of Beam Sensitive Materials

Understanding Deformation and Failure Mechanisms via Multimodal and Multiscale Electron Diffraction Analysis

In-Situ Bending and Structural Characterization of Penta-Twinned Silver Nanowires

Gazing at Crystal Balls – Electron Backscatter Diffraction Indexing and Cross Correlation on a Sphere

Diffraction Mapping with a Pixelated Detector to Quantify Crystal Orientation in 3D Structures Made from 2D Materials

Improved 4D-STEM Strain Mapping Precision Using Patterned Probes

High Throughput Grain Mapping with Sub-Nanometer Resolution by 4D-STEM

Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Physical Science Symposia

Electron Crystallography of Nano-structures in Nanotechnology, Materials and Bio-Sciences