Microscopy and Microanalysis: Volume 25 - Issue S2

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Physical Science Symposia

Revealing the Fundamental Structure of Soft and Hard Matter by Minimizing Beam-Sample Interactions

Atomic Scale Debye-Waller Thermometry

Development of a Dynamic Environment Transmission Electron Microscope for the Study of Fast Phenomena in Nanoscale Materials

Reducing Radiation Damage Using Pulsed Electron Beams in the TEM

Nanoscale Structural Dynamics Probed by Coherent Ultrafast TEM

Anisotropic Structural Dynamics of Few-Layer Black Phosphorus Revealed by Ultrafast Electron Microscopy

Towards Atomic Resolution Electron Microscopy with Structured Temporal Electron Illumination of Picosecond Time Resolution

Measuring Single Electrons – What Does it Mean?

Secondary-Electron Electron-Beam-Induced Current Measurements at Lattice Resolution

Laser-Free GHz Stroboscopic TEM: Construction, Deployment, and Benchmarking

Cryogenic STEM Imaging and Spectroscopy of Electron Beam Sensitive Materials

Electron Ptychography Using Fast Binary 4D STEM Data

Phase Contrast in Quantum Electron Microscopy

Resonant RF Cavity Based Beam Chopping for Precise Control over Electron Arrival Time Distribution

Challenges in Revealing Soft Matter Structural Dynamics by Liquid Phase Electron Microscopy

Impact of Electron Energy and Dose on Particle Dynamics Imaging in the Scanning Electron Microscope

A Fluorescence Microscopy Assay for Assessing Beam Damage to Nanoparticle Capping Ligands During Liquid Cell Electron Microscopy

Damage by Induced Electric Field versus Radiolysis

Advancing Atomic-Resolution TEM of Electron Beam-Sensitive Crystalline Materials from “Impossible” to “Routine”

From Control of the Electron Beam to Control of Single Atoms

Environment-Dependent Electron Beam Reduction of Rutile Nanocrystals at High Temperatures

Microscopy and Microanalysis

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Volume 25 - Supplement S2 - August 2019

Physical Science Symposia

Revealing the Fundamental Structure of Soft and Hard Matter by Minimizing Beam-Sample Interactions