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Impact of Electron Energy and Dose on Particle Dynamics Imaging in the Scanning Electron Microscope

Published online by Cambridge University Press:  05 August 2019

Yige Gao ,
Satyam Srivastava ,
Paul Y. Kim ,
David A. Hoagland ,
Thomas P. Russell  and
Alexander E. Ribbe
Yige Gao
Affiliation:
Polymer Science & Engineering Department, University of Massachusetts, Amherst, United States.
Satyam Srivastava
Affiliation:
Polymer Science & Engineering Department, University of Massachusetts, Amherst, United States.
Paul Y. Kim
Affiliation:
Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California, United States.
David A. Hoagland
Affiliation:
Polymer Science & Engineering Department, University of Massachusetts, Amherst, United States.
Thomas P. Russell
Affiliation:
Polymer Science & Engineering Department, University of Massachusetts, Amherst, United States. Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California, United States.
Alexander E. Ribbe*
Affiliation:
Polymer Science & Engineering Department, University of Massachusetts, Amherst, United States.
*
*Corresponding author: [email protected]

Abstract

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Type
Revealing the Fundamental Structure of Soft and Hard Matter by Minimizing Beam-Sample Interactions
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1670 - 1671
Copyright
Copyright © Microscopy Society of America 2019 

References

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