Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-27T15:49:51.544Z Has data issue: false hasContentIssue false

Development of a Dynamic Environment Transmission Electron Microscope for the Study of Fast Phenomena in Nanoscale Materials

Published online by Cambridge University Press:  05 August 2019

Renske M. van der Veen*
Affiliation:
University of Illinois at Urbana-Champaign, Department of Chemistry, Urbana, USA.
*
*Corresponding author: [email protected]

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Revealing the Fundamental Structure of Soft and Hard Matter by Minimizing Beam-Sample Interactions
Copyright
Copyright © Microscopy Society of America 2019