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Phase Contrast in Quantum Electron Microscopy

Published online by Cambridge University Press:  05 August 2019

Pieter Kruit ,
Maurice Krielaart  and
Yuri van Staaden
Pieter Kruit*
Affiliation:
Delft University of Technology, Department of Imaging Physics, Delft, The Netherlands.
Maurice Krielaart
Affiliation:
Delft University of Technology, Department of Imaging Physics, Delft, The Netherlands.
Yuri van Staaden
Affiliation:
Delft University of Technology, Department of Imaging Physics, Delft, The Netherlands.
*
*Corresponding author: [email protected]

Abstract

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Type
Revealing the Fundamental Structure of Soft and Hard Matter by Minimizing Beam-Sample Interactions
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1664 - 1665
Copyright
Copyright © Microscopy Society of America 2019 

References

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[2]Putnam, W and Yanik, M, Phys. Rev. A 80 (2009), p. 040902.Google Scholar
[3]Kruit, P et al. , Ultramicroscopy (2016). doi:10.1016/j.ultramic.2016.03.004.Google Scholar
[4]Thomas, S et al. , Phys. Rev. A 90 (2014), p. 053840.Google Scholar
[5]Juffmann, T et al. , Scientific Reports 7 (2017), p. 1699. doi:10.1038/s41598-017-01841-xGoogle Scholar
[6]The authors acknowledge funding from the Gordon and Betty Moore Foundation and the Netherlands Organization for Scientific Research (NWO).Google Scholar