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Measuring Single Electrons – What Does it Mean?

Published online by Cambridge University Press:  05 August 2019

Henning Ryll ,
Martin Huth ,
Robert Ritz ,
Colum M. O'Leary ,
Ian Griffiths ,
Peter Nellist ,
Ryusuke Sagawa ,
Yukihito Kondo ,
Heike Soltau  and
Lothar Strüder
Henning Ryll*
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 München, Germany
Martin Huth
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 München, Germany
Robert Ritz
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 München, Germany
Colum M. O'Leary
Affiliation:
Department of Materials, University of Oxford, 13 Parks Road, Oxford OX13PH, UK
Ian Griffiths
Affiliation:
Department of Materials, University of Oxford, 13 Parks Road, Oxford OX13PH, UK
Peter Nellist
Affiliation:
Department of Materials, University of Oxford, 13 Parks Road, Oxford OX13PH, UK
Ryusuke Sagawa
Affiliation:
JEOL Ltd., 3-1-2 Musashino Akishima Tokyo 196-8558, Japan
Yukihito Kondo
Affiliation:
JEOL Ltd., 3-1-2 Musashino Akishima Tokyo 196-8558, Japan
Heike Soltau
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 München, Germany
Lothar Strüder
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 München, Germany
*
*Corresponding authors: [email protected]

Abstract

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Type
Revealing the Fundamental Structure of Soft and Hard Matter by Minimizing Beam-Sample Interactions
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1654 - 1655
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Ryll, H., et al. , Journal of Instrumentation 11 (2016)Google Scholar