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Resonant RF Cavity Based Beam Chopping for Precise Control over Electron Arrival Time Distribution

Published online by Cambridge University Press:  05 August 2019

Erik Kieft ,
Jasper van Rens ,
Wouter Verhoeven ,
Peter Mutsaers  and
Jom Luiten
Erik Kieft*
Affiliation:
Thermo Fisher Scientific, Eindhoven, the Netherlands.
Jasper van Rens
Affiliation:
Department of Applied Physics, Coherence and Quantum Technology Group, Eindhoven University of Technology, Eindhoven, the Netherlands.
Wouter Verhoeven
Affiliation:
Department of Applied Physics, Coherence and Quantum Technology Group, Eindhoven University of Technology, Eindhoven, the Netherlands.
Peter Mutsaers
Affiliation:
Department of Applied Physics, Coherence and Quantum Technology Group, Eindhoven University of Technology, Eindhoven, the Netherlands.
Jom Luiten
Affiliation:
Department of Applied Physics, Coherence and Quantum Technology Group, Eindhoven University of Technology, Eindhoven, the Netherlands.
*
*Corresponding author: [email protected]

Abstract

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Type
Revealing the Fundamental Structure of Soft and Hard Matter by Minimizing Beam-Sample Interactions
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1666 - 1667
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Zewail, AH, Annu.Rev.Phys.Chem. 57 (2006) p. 65.Google Scholar
[2]LaGrange, T et al. , Micron 43 (2012) p 1108.Google Scholar
[3]Kisielowski, C et al. , Phys. Rev. B 88 (2013), 024305.Google Scholar
[4]Barthel, J, Lentzen, M and Thrust, A, Ultramicroscopy 176 (2017) pp 37-45.Google Scholar
[5]Kisielowski, C et al. , Adv. Funct. Mater. (2019), 1807818.Google Scholar
[6]Kisielowski, C et al. , these proceedings.Google Scholar
[7]Verhoeven, W et al. , https://arxiv.org/abs/1811.02243Google Scholar
[8]van Rens, JFM et al. , Appl. Phys. Lett. 113 (2018), 163104.Google Scholar
[9]Kiewiet, FB et al. , Nucl.Instrum.Meth.Phys.Res.A 484 (2002), 619.Google Scholar
[10]This work is part of an Industrial Partnership Programme of the Netherlands Organisation for Scientific Research (NWO). The authors would like to thank E.H. Rietman, I. Koole, H.A. van Doorn, and A.H. Kemper for their invaluable technical support.Google Scholar