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Electron Ptychography Using Fast Binary 4D STEM Data

Published online by Cambridge University Press:  05 August 2019

Colum M. O'Leary ,
Emanuela Liberti ,
Sean M. Collins ,
Duncan N. Johnstone ,
Mathias Rothmann ,
Jingwei Hou ,
Christopher S. Allen ,
Judy S. Kim ,
Thomas D. Bennett  and
Paul A. Midgley
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Colum M. O'Leary
Affiliation:
Department of Materials, University of Oxford, Oxford, UK.
Emanuela Liberti
Affiliation:
Department of Materials, University of Oxford, Oxford, UK. electron Physical Sciences Imaging Centre (ePSIC), Diamond Light Source, UK.
Sean M. Collins
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, UK.
Duncan N. Johnstone
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, UK.
Mathias Rothmann
Affiliation:
Department of Materials, University of Oxford, Oxford, UK.
Jingwei Hou
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, UK.
Christopher S. Allen
Affiliation:
Department of Materials, University of Oxford, Oxford, UK. electron Physical Sciences Imaging Centre (ePSIC), Diamond Light Source, UK.
Judy S. Kim
Affiliation:
Department of Materials, University of Oxford, Oxford, UK. electron Physical Sciences Imaging Centre (ePSIC), Diamond Light Source, UK.
Thomas D. Bennett
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, UK.
Paul A. Midgley
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, UK.
Angus I. Kirkland
Affiliation:
Department of Materials, University of Oxford, Oxford, UK. electron Physical Sciences Imaging Centre (ePSIC), Diamond Light Source, UK.
Peter D. Nellist
Affiliation:
Department of Materials, University of Oxford, Oxford, UK.

Abstract

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Type
Revealing the Fundamental Structure of Soft and Hard Matter by Minimizing Beam-Sample Interactions
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1662 - 1663
Copyright
Copyright © Microscopy Society of America 2019 

References

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[5]Rodenburg, J. M., McCallum, B. C. and Nellist, P. D., Ultramicroscopy 48 (1993), p. 304-314.Google Scholar
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[7]The financial support of JEOL (UK) Ltd. and the EPSRC is gratefully acknowledged.Google Scholar