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Characterization of Semiconductor Nanowires by HRTEM and In-Situ TEM

Published online by Cambridge University Press:  26 July 2009

N Wang
N Wang*
Affiliation:
The Hong Kong University of Science and Technology,Hong Kong

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1186 - 1187
Copyright
Copyright © Microscopy Society of America 2009