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In Situ and High Resolution TEM Studies of Nano-scale Materials

Published online by Cambridge University Press:  26 July 2009

R Sinclair ,
AL Koh ,
P Kempen  and
HJ Jung
R Sinclair
Affiliation:
Stanford University
AL Koh
Affiliation:
Stanford University
P Kempen
Affiliation:
Stanford University
HJ Jung
Affiliation:
Stanford University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1200 - 1201
Copyright
Copyright © Microscopy Society of America 2009