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Volume 15 - Supplement S2 - July 2009

Contents

Page 33 of 39

Physical Sciences

Microscopy and Microanalysis of Nanostructured Materials

Abstract

  • Growth and Microstructural Properties of Nitride-Based Nanostructures

  • YH Kim, H Ryu, YH Shin, MD Kim
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1286-1287
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Structural and Morphological Characterization of Catalytically-Active Co3O4 Powders

  • S Prikhodko, L Chen, S Kodambaka, R Richards
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1288-1289
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Automated Crystal Orientation and Phase Mapping of Iron Oxide Nano-Crystals in a Transmission Electron Microscope

  • S Rouvimov, EF Rauch, P Moeck, S Nicolopoulos
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1290-1291
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Electron Microscopy and Spectroscopy of Au-coated Carbon Nanotubes for Electron Field Emission Applications

  • JM Green, J Jiao
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1292-1293
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • TEM Observations of Nano-porous Hematite Formed by Dehydration of Synthetic Goethite Particles

  • J Steele
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1294-1295
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Microstructural Analysis of Fe35Pt49Cu16 Thin Films

  • BC Hornbuckle, K Torres, R Morris, G Thompson
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1296-1297
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • High Resolution Electron Microscopy of Nanostructure on the Surface of commercial FCC Catalyst

  • YL Tang, M Allahverdi, WJ Reagan
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1302-1303
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Application of Electron Tomography on DRAM Structures

  • S Wang
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1304-1305
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • TEM Characterization of Novel Nano-hybrid Materials

  • M Saunders, S Iyer, C Raston, C Bond
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1306-1307
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Visualization of Hydrogels with Variable-Pressure SEM

  • L-M Joubert
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1308-1309
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Electron Microscopy Characterization of ZnO:Mn Nanowires

  • M Eastman, J Jiao
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1310-1311
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Phase Characterization of Two-Phase BiSn Alloy Nanoparticles Using Conventional TEM and EFTEM Spectral Imaging Techniques

  • CT Schamp, W-S Cheng, WA Jesser
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1314-1315
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Determination of Oxygen Content in Pulsed Laser Deposited InN Thin Films with Analytical Electron Microscopy

  • G Drazic, E Sarantopoulou, Z Kollia, A-C Cefalas, S Kobe
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1316-1317
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Complementary Analytical TEM Analysis of Perpendicular Recording Media

  • S Park, NT Nuhfer, DE Laughlin, J-G Zhu
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1318-1319
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Synthesis and Characterization of CuO Nanowires and Nanobelts

  • WC Lowes, J Liu
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1322-1323
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Synthesis of Cu and CuOx Nanowires via Reduction of CuO Nanowires

  • WC Lowes, J Liu
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1324-1325
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 33 of 39