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A New Laboratory Designed to Provide an Optimum Environment for Aberration-Corrected Electron Microscopes

Published online by Cambridge University Press:  01 August 2002

L. F. Allard ,
D. A. Blom ,
T. A. Nolan ,
W. H. Sides ,
L. J. Degenhardt ,
J. A. Mayo ,
W. Vogen  and
E. St. Romain
L. F. Allard
Affiliation:
Oak Ridge National Laboratory, PO Box 2008, Oak Ridge, TN 37831-6064
D. A. Blom
Affiliation:
Oak Ridge National Laboratory, PO Box 2008, Oak Ridge, TN 37831-6064
T. A. Nolan
Affiliation:
Oak Ridge National Laboratory, PO Box 2008, Oak Ridge, TN 37831-6064
W. H. Sides
Affiliation:
Oak Ridge National Laboratory, PO Box 2008, Oak Ridge, TN 37831-6064
L. J. Degenhardt
Affiliation:
Oak Ridge National Laboratory, PO Box 2008, Oak Ridge, TN 37831-6064
J. A. Mayo
Affiliation:
Oak Ridge National Laboratory, PO Box 2008, Oak Ridge, TN 37831-6064
W. Vogen
Affiliation:
Vibration Engineering Associates, 4555 Paul Sweet Road, Santa Cruz, CA 95065
E. St. Romain
Affiliation:
Lord, Aeck & Sargent, 1201 Peachtree Street, NE Ste 300, Atlanta, GA 30361-3500

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 478 - 479
Copyright
Copyright © Microscopy Society of America 2002