Proceedings of Microscopy & Microanalysis 2017
Plenary Session
Abstract
Imaging Cellular Structure and Dynamics from Molecules to Organisms
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- 04 August 2017, pp. 2-3
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Detecting Massive Black Holes via Attometry: Gravitational Wave Astronomy Begins
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- 04 August 2017, pp. 4-5
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Analytical and Instrumentation Science Symposia
Vendor Symposium
Abstract
Probing the Element Distribution at the Organic-Inorganic Interface Using EDS
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- 04 August 2017, pp. 6-7
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ZEISS Crossbeam - Advancing Capabilities in High Throughput 3D Analysis and Sample Preparation
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- 04 August 2017, pp. 8-9
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A Dedicated Backscattered Electron Detector for High Speed Imaging and Defect Inspection
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- 04 August 2017, pp. 10-11
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Large Area 3D Structural Characterization by Serial Sectioning Using Broad Ion Beam Argon Ion Milling
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- 04 August 2017, pp. 12-13
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New Scios CryoTM - Dedicated FIB/SEM for Advanced Cryo-Lamella Preparation in Structural Biology
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- 04 August 2017, pp. 14-15
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Advances in Serial-Section Broad-Ion-Beam Tomography
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- 04 August 2017, pp. 16-17
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Three Dimensional Optical Microstructure Analysis of Ferrite and Pearlite Phases in a Medium Carbon Steel
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- 04 August 2017, pp. 18-19
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Temporal Compressive Sensing Instrumentation for TEM
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- 04 August 2017, pp. 20-21
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Developments in AZtec: New Solutions for EBSD
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- 04 August 2017, pp. 22-23
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A Detection System with Controlled Surface Sensitivity for a New UHR SEM
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- 04 August 2017, pp. 24-25
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Correlative In-Situ AFM & SEM & EDX Analysis of Nanostructured Materials
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- 04 August 2017, pp. 26-27
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Automated Image Analysis Using a Tabletop Low Voltage TEM
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- 04 August 2017, pp. 28-29
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Progress in a New Method of Thickness Measurement by X-ray Analysis in TEM
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- 04 August 2017, pp. 30-31
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Developments in Reel-to-Reel Electron Microscopy Infrastructure
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- 04 August 2017, pp. 32-33
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Numerical Procedures to determine Potential Distribution from Electronic Field Vectors observed in Differential Phase Contrast (DPC) imaging
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- 04 August 2017, pp. 34-35
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Wide Field-of-View Reflection-Mode Ptychographic Imaging Microscope with Tabletop 12.7 nm High Harmonic Illumination
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- 04 August 2017, pp. 36-37
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A New SEM Column Combining Ultra-High Resolution and Flexible Scanning
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- 04 August 2017, pp. 38-39
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Hardware and Software Advances in Commercially Available Atom Probe Tomography Systems
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- 04 August 2017, pp. 40-41
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